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254. Multivalued distributions of hot electrons between equivalent valleys.

257. HOT-CARRIER NOISE OF LIGHTLY DOPED p-Si AT 77 K.

262. A Percolative Approach to Reliability of Thin Films.

263. Bulk hot-electron properties of cubic semiconductors.

264. Hole drift velocity in natural diamond

270. ole drift velocity in silicon

285. Monte Carlo algorithm for generation-recombination noise in semiconductors.

286. Monte Carlo Analysis of Quantum Transport and Fluctuations in Semiconductor 2

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