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251. Single-Event Testing of the Texas Instruments SNV54LVC00AW Quadruple 2-Input Positive-NAND Gates

252. NASA RHA Update and Workforce Development

254. The Creation and Simulation of a Risley Prism Assembly

255. Total Ionizing Dose Test of Silicon Switching Transistors JANTXV2N2222AUB

256. RH1021BMH-10 Precision 10 V Reference Total Ionizing Dose Test Report

257. Modeling and Mitigation of Multi-Loops Related Device Overvoltage in Three Level Active Neutral Point Clamped Converter

260. FPGA Mitigation Strategies for Critical Applications

261. Cavity Environmental Control System Upgrade for NASA's Stratospheric Observatory for Infrared Astronomy

262. Implications of hierarchical name resolution and name space in dynamic distributed networks

264. Theory and practice of system development methodologies : a conceptual framework

269. Indoor Localization Using Barely Perceptible Audio Signals

270. International Space Station Lithium-Ion Battery Status

271. Safe, High Power / Voltage Battery Design Challenges

273. Characterization and Failure Analysis of 650 V Enhancement-Mode GaN HEMT for Cryogenically-Cooled Power Electronics

274. Advanced Electronics for the SONTRAC Neutron Spectrometer

275. Portable Laser Guided Robotic Metrology System

276. AFRC Wireless Development Plans and Needs

277. Star Tracker Accuracy Improvement and Optimization for Attitude Measurement in Three-Axis

279. Physics of Failure Approaches to Assessing Impacts of Assembly Level Rework Maintenance

280. Failure of Nd:YVO4 Amplifier Crystals

281. A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash

282. Thermal Analysis of Potted Litz Wire for High-Power-Density Aerospace Electric Machines

283. Overview of Multi-Layer Metal Insulation Development for Small Stirling Convertors at NASA GRC

284. OMH3075 Hall Effect Sensor Total Ionizing Dose Test Report

285. Comprehensive Software Simulation on Ground Power Supply for Launch Pads and Processing Facilities at NASA Kennedy Space Center

286. Standardizing Microprocessor and GPU Radiation Test Approaches

287. MUSTANG Applications

288. Troubleshooting Challenges on the James Webb Space Telescope (JWST)

289. Proton Testing of AMD Ryzen 3 2200G Microprocessors

290. Proton Testing of AMD Ryzen 3 1200 Microprocessors

291. Atomic Layer Deposition Josephson Junctions for Cryogenic Circuit Applications

292. Micromilling of Uniform Nanoparticles for Space Applications

293. Common Mode Conducted Emissions

294. Proton Testing of nVidia Jetson TX2

295. Proton Testing of AMD e9173 GPU

296. Risk Methodology for SEE Caused by Proton-Induced Fission of High-Z Materials in Microelectronics Packaging

297. Room Temperature Radiation Testing of a 500 °C Durable 4H-SiC JFET Integrated Circuit Technology

298. A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash

299. NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

300. Electromagnetic Modeling for the Conformal Lightweight Antenna System for Aeronautical Communications Technologies (CLAS-ACT) Program: Final Report

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