629 results on '"Gerardi, C."'
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202. Memory effects in MOS capacitors with silicon rich oxide insulators.
203. Correlation of dot size distribution with luminescence and electrical transport of Si quantum dots embedded in SiO2
204. Memory effects in MOS capacitors with silicon rich oxide insulators
205. Effects of Nitridation by N2O or No on the Electrical Properties of Thin Gate or Tunnel Oxides
206. Determination of Mg concentration and distribution in MgxZn1-xO films for photonic devices application.
207. Degradation and hard breakdown transient of thin gate oxides in metal-SiO2-Si capacitors: dependance on oxide thickness
208. Soft breakdown of gate oxides in metal–SiO2–Si capacitors under stress with hot electrons
209. Nitridation of Thin Gate or Tunnel Oxides by Nitric Oxide
210. MBE growth and characterisation of AlxGa1−xSb layers on GaSb substrates
211. III-V compounds and piezoelectric ceramic thin films deposited by reactive PLD: application to sensor building
212. Tungsten trioxide (WO3) sputtered thin films for a NOx gas sensor
213. Impact of Al interdiffusion on optical properties in GaSb/AlGaSb multiple quantum wells
214. Deposition of GaN thin films by laser ablation of liquid Ga target in nitrogen-reactive atmosphere
215. GaN thin films deposition by laser ablation of liquid Ga target in nitrogen reactive atmosphere
216. Boron carbon nitride films deposited by sequential pulses laser deposition
217. Epitaxial piezoelectric PZT thin films obtained by pulsed laser deposition
218. Characterization of polypyrrole containing Langmuir-Blodgett films by surface specific techniques
219. Lasing and dynamics of photoexcited carriers in graded-index separate confinement Zn1−xCdxSe single quantum wells
220. Thermal and electrostatic stability of biexcitons in Zn1−xCdxSe/ZnSe quantum wells
221. A parametric study of AlN thin films grown by pulsed laser deposition
222. High-resolution depth profiling of In[sub x]Ga[sub 1−x]As/GaAs multiple quantum well structures by combination of secondary ion mass spectrometry and x-ray diffraction techniques
223. SIMS Analyses of III-V Semiconductor Quantum-well and Superlattice Heterostructures
224. AlN thin films deposition by laser ablation of Al target in nitrogen reactive atmosphere
225. Surface characterization of Langmuir-Blodgett polypyrrole films obtained by a solid-state reaction
226. Structural and optical studies of InxGa1−xAs/GaAs multiple quantum wells
227. Characterisation of thin amorphous silicon films with multiple internal reflectance spectroscopy
228. SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples
229. Metalorganic vapour phase epitaxy growth of ZnS layers by (t-Bu)SH and Me2Zn:Et3N precursors
230. Laser-assisted controlled in-diffusion processes for preparation of optical waveguides and ultrashallow semiconductor junctions
231. SIMS and X-ray diffraction characterization of carbon-doped GaAs, AlxGa1 −xAs films grown by MBE
232. Carbon incorporation in GaAs and AlxGa1−xAs layers grown by molecular-beam epitaxy
233. Alpha interferon treatment of chronic hepatitis C in beta-thalassaemia.
234. Radiation damage evolution and its relation with dopant distribution during self-annealing implantation of As in silicon
235. High fluence implantation in glasses: chemical interactions
236. III-V compounds and piezoelectric ceramic thin films deposited by reactive PLD: application to sensor building.
237. Deposition of GaN thin films by laser ablation of liquid Ga target in nitrogen-reactive atmosphere.
238. Laser-assisted controlled in-diffusion processes for preparation of optical waveguides and ultrashallow semiconductor junctions.
239. Sour cherry (Prunus cerasus L) anthocyanins as ingredients for functional foods.
240. Performance and reliability features of advanced nonvolatile memories based on discrete traps (silicon nanocrystals, SONOS).
241. SIMS and X-ray diffraction characterization of carbon-doped GaAs, Al xGa1 − xAs films grown by MBE.
242. High-resolution depth profiling of InxGa1-xAs/GaAs multiple quantum well structures by combination of secondary ion mass spectrometry and x-ray diffraction techniques.
243. Purification and characterisation of a b-glucosidase abundantly expressed in ripe sweet cherry (Prunus avium L.) fruit
244. Nitridation of gate and tunnel oxides employed in CMOS-ULSI technology
245. MBE growth and characterisation of AlxGa1-xSb layers on GaSb substrates
246. Room-temperature single-electron effects in silicon nanocrystal memories.
247. Thermal and electrostatic stability of biexcitons in Zn 1− x Cd x Se/ZnSe quantum wells
248. Lasing and dynamics of photoexcited carriers in graded-index separate confinement Zn 1− x Cd x Se single quantum wells
249. Thermal and electrostatic stability of biexcitons in Zn~1~-~xCd~xSe/ZnSe quantum wells
250. Lasing and dynamics of photoexcited carriers in graded-index separate confinement Zn~1~-~xCd~xSe single quantum wells
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