742 results on '"Korhonen M"'
Search Results
152. Levels of PCDD, PCDF and PCB in dated lake sediments in Subarctic Finland
153. Concentrations of selected PCB congeners in pike (Esox lucius, L.) and arctic char (Salvelinus alpinus, L.) in Finland
154. The effect of current density and stripe length on resistance saturation during electromigration testing
155. Electromigration Failure Distributions for Multi-Layer Interconnects as a Function of Line Width: Experiments and Simulation
156. Stress and alloying effects in electromigration
157. Cluster interactions and stress evolution during electromigration in confined metal interconnects
158. Differential expression of laminin polypeptides in developing and adult human kidney.
159. Fatigue Crack Growth Behavior of Small Sn-Bi-Ag Solder Joints
160. Statistics of stress migration and electromigration failures of passivated interconnect lines
161. The Leachability of Lignin from Kraft Pulps after Xylanase Treatment
162. Stress evolution during stress migration and electromigration in passivated interconnect lines
163. 3-D finite element simulator for migration effects due to various driving forces in interconnect lines.
164. Statistical distributions of stress and electromigration-induced failure
165. Mechanical Properties of Plated Copper
166. Microstructure Based Modelling of Stress Migration and Electromigration Induced Failure Distributions
167. Micromechanical Testing of Electronic Packaging Components and Materials
168. Prediction and Prevention of Stress Migration and Electromigration Damage in Passivated Lines
169. Estimation of Thermal Stresses and Stress Concentrations in Confined Interconnect Lines of Rectangular Cross Section
170. Electromigration‐induced failure in passivated aluminum‐based metallizations−The dependence on temperature and current density
171. Stress-induced voiding and electromigration
172. Observations of water masses and circulation in the Eurasian Basin of the Arctic Ocean from the 1990s to the late 2000s.
173. Time and space variability of freshwater content, heat content and seasonal ice melt in the Arctic Ocean from 1991 to 2011.
174. A longitudinal study of maternal prenatal, postnatal and concurrent depressive symptoms and adolescent well-being.
175. Mortality associated with benzodiazepines and benzodiazepine-related drugs among community-dwelling older people in Finland: a population-based retrospective cohort study.
176. Statistical distributions of stress and electromigration-induced failure.
177. Stress and electromigration modelling for confined chip level interconnect lines.
178. Stress evolution during stress migration and electromigration in passivated interconnect lines.
179. Stress-induced voiding and electromigration.
180. Stress-induced voiding and stress relaxation in passivated aluminum line metallizations.
181. Transient thermal management in electronic packaging using dynamic control of power dissipation and heat transfer.
182. Flip Chip Metallurgies for Lead-Free Solders.
183. Under Bump Metallization Development for Eutectic Pb-Sn Solders.
184. A Practice-Based Study of the Variation of Diagnostics of Dental Caries in New and Old Patients of Different Ages.
185. Bone marrow mesenchymal stem cells undergo nemosis and induce keratinocyte wound healing utilizing the HGF/c-Met/PI3K pathway.
186. New cellular therapies: Is there a role for transfusion services?
187. Off-label and unlicensed drug prescribing in three paediatric wards in Finland and review of the international literature.
188. The Effect of a Passivation Over-Layer on Tile Mechanisms of Stress Relaxation in Continuous Films and Narrow Lines of Aluminum
189. The Effect of Line Geometry on Void Growth in Thin, Narrow Aluminum Lines
190. Stress Induced Void Nucleation in Narrow Aluminum Alloy Lines
191. Thermal Stress Induced Void Formation in Narrow Passivated Cu Lines
192. Electromigration in Aluminum Based Interconnects of VLSI-Microcircuits, with and without Preceding Stress-Migration Damage
193. Electromigration Damage by Current Induced Coalescence of Thermal Stress Voids
194. Mechanisms of Inelastic Deformation and Stress Relaxation in Thin Metallizations Bonded to Hard Substrates
195. Void Growth as a Function of Residual Stress Level in Thin, Narrow Aluminum Lines
196. Effects of combined strength and sprint training on regulation of muscle contraction at the whole-muscle and single-fibre levels in elite master sprinters.
197. The alpha 1-alpha 6 subunits of integrins are characteristically expressed in distinct segments of developing and adult human nephron.
198. Enhanced attention-dependent auditory processing by electroconvulsive therapy in psychotic depression.
199. Homocysteine as a risk factor for CVD mortality in men with other CVD risk factors: the Kuopio Ischaemic Heart Disease Risk Factor (KIHD) Study.
200. The Formation and Morphology of Stress Induced Voids in Thin Narrow Aluminum Lines
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.