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102. Endurance/Retention Trade Off in HfOx and TaOx Based RRAM

104. Vertical CBRAM (V-CBRAM): From Experimental Data to Design Perspectives

107. Functionality and reliability of resistive RAM (RRAM) for non-volatile memory applications

109. Temperature impact (up to 200°C) on performance and reliability of HfO2-based RRAMs

110. Temperature impact (up to 200 °C) on performance and reliability of HfO2-based RRAMs

112. Investigation of the potentialities of Vertical Resistive RAM (VRRAM) for neuromorphic applications

116. Benefit of Al2O3/HfO2 bilayer for BEOL RRAM integration through 16kb memory cut characterization

120. Investigation of the role of H-related defects in Al2O3 blocking layer on charge-trap memory retention by atomistic simulations and device physical modelling

121. Investigation of the impact of H-related defects in Al2O3 blocking layer of charge-trap memories by atomistic simulations and device physical modeling

124. Theoretical insights and experimental characterization of $$\hbox {HfO}_2$$ -based OxRRAMs operation.

126. Hypertension in adult Fabry's disease: Is cardiotrophin-1 a diagnostic biomarker?

129. Resistive Memories for Ultra-Low-Power embedded computing design

130. Future challenges and opportunities for heterogeneous process technology. Towards the thin films, Zero Intrinsic Variability devices, Zero Power era

132. CBRAM corner analysis for robust design solutions

133. Investigation of HfO2/Ti based vertical RRAM - Performances and variability

138. 28nm advanced CMOS resistive RAM solution as embedded non-volatile memory

139. Effect of SET temperature on data retention performances of HfO2-based RRAM cells

141. Investigation of the physical mechanisms governing data-retention in down to 10nm nano-trench Al2O3/CuTeGe conductive bridge RAM (CBRAM)

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