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101. A High-Performance InAs/GaSb Core-Shell Nanowire Line-Tunneling TFET: An Atomistic Mode-Space NEGF Study

102. A Simulation Perspective: The Potential and Limitation of Ge GAA CMOS Devices

108. Calibration of Dynamic Building Energy Models with Multiple Responses Using Bayesian Inference and Linear Regression Models

109. Determining the cost optimum among a discrete set of building technologies to satisfy stringent energy targets

110. Expression of trehalose-6-phosphate phosphatase in maize ears improves yield in well-watered and drought conditions

111. Formation of multiple dislocations in Si solid-phase epitaxy regrowth process using stress memorization technique

113. Prediction based on the Kennedy-O’Hagan calibration model: asymptotic consistency and other properties

114. On Prediction Properties of Kriging: Uniform Error Bounds and Robustness

116. Effect of alloy seed on Cu interconnect electromigration and stress migration

117. Exploring HVAC system sizing under uncertainty

118. Quantification of model form uncertainty in the calculation of solar diffuse irradiation on inclined surfaces for building energy simulation

119. Three-phase optimal design of sensitivity experiments

120. A Generalized Gaussian Process Model for Computer Experiments With Binary Time Series.

121. On Prediction Properties of Kriging: Uniform Error Bounds and Robustness.

122. Comprehensive comparisons of major sequential design procedures for sensitivity testing.

123. Via Impact on the Upstream Electromigration of 40/45nm Low-k Cu Interconnect

124. On the Choice of Nugget in Kriging Modeling for Deterministic Computer Experiments

125. Hidden Markov Models With Applications in Cell Adhesion Experiments

126. The Failure Mechanism Worst Stress Condition for Hot Carrier Injection of NMOS

127. A generalized Gaussian process model for computer experiments with binary time series

128. Uncertainty quantification of microclimate variables in building energy models

129. Investigations of hot carrier injection on NMOSFET with high Vds and low Vgs stress

130. Worst Case Stress Conditions for Hot Carrier Degradation with Technology Nodes from 0.35µm to 45nm

131. Generalized selective assembly

132. Another Look at Dorian Shainin's Variable Search Technique

133. Rejoinder

134. Physics and performances of III–V nanowire broken-gap heterojunction TFETs using an efficient tight-binding mode-space NEGF model enabling million-atom nanowire simulations

135. Effects of Warpage on Fatigue Reliability of Solder Bumps: Experimental and Analytical Studies

136. Optimizing and Improving the Growth Quality of ZnO Nanowire Arrays Guided by Statistical Design of Experiments

137. Bayesian-inspired minimum aberration two- and four-level designs

138. Sliced space-filling designs

139. Statistical Modeling and Analysis for Robust Synthesis of Nanostructures

140. Modeling and Analysis Strategies for Failure Amplification Method

141. Selected Works of Peter J. Bickel

142. Binary Time Series Modeling With Application to Adhesion Frequency Experiments

143. The future of industrial statistics: A panel discussion

144. An efficient surrogate model for emulation and physics extraction of large eddy simulations

145. A skewed version of the Robbins-Monro-Joseph procedure for binary response

146. Magnetic thin-film inductors for monolithic integration with CMOS

147. Efficient calibration for imperfect computer models

148. Impact of SMT-induced edge dislocation positions to NFET performance

149. One-factor-at-a-time designs of resolution V

150. Morpheme structure constraints on two-handed signs in American Sign Language

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