579 results on '"Kisielowski C"'
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52. Electron channelling based crystallography
53. Determination of the atomic structure of a Σ13 SrTiO3 grain boundary
54. High-Resolution Interface Atomic Structure Analysis in Silicon Nitride Ceramics
55. Synthesis and Microstructures of α-Fe2O3 Bicrystalline Nanowires
56. Local band and defect transitions in InGaN observed by valence electron energy loss spectroscopy
57. Time, energy, and spatially resolved TEM investigations of defects in InGaN
58. Local indium segregation and bang gap variations in high efficiency green light emitting InGaN/GaN diodes
59. Zincblende and wurtzite phases in InN epilayers and their respective band transitions
60. X-Ray Photoemission Spectromicroscopy of Gan and AIGan
61. Control of the structure and surface morphology of gallium nitride and aluminum nitride thin films by nitrogen background pressure in pulsed laser deposition
62. Nonlinear imaging using annular dark field TEM
63. Band transitions in wurtzite GaN and InN determined by valence electron energy loss spectroscopy
64. Stress Controlled MBE-growth of GaN:Mg and GaN:Si
65. Effect of Mg, Zn, Si, and O on the Lattice Constant of Gallium Nitride Thin Films
66. MBE-Growth of Strain Engineered GaN Thin Films Utilizing a Surfactant
67. Stress Gradients In Heteroepitaxial Gallium Nitride Films
68. Compositional analysis of mixed–cation-anion III–V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopy
69. Structural characterization of bulk GaN crystals grown under high hydrostatic pressure
70. Determination of the atomic structure of a ∑13 SrTiO3 grain boundary
71. Homoepitaxial growth of GaN using molecular beam epitaxy
72. The effect of excess gallium vacancies in low-temperature GaAs/AlAs/GaAs:Si heterostructures
73. A HRTEM study of metastable phase formation in Al–Mg–Cu alloys during artificial aging
74. Decomposition of an Al–Mg–Cu alloy—a high resolution transmission electron microscopy investigation
75. Quasi-epitaxial growth of thick CuInS 2 films by RF reactive sputtering with a thin epilayer buffer
76. Annular dark field imaging in a TEM
77. The influence of structural properties on conductivity and luminescence of MBE grown InN
78. Chapter 4 Defect Processes in Semiconductors Studied at the Atomic Level by Transmission Electron Microscopy
79. Low Dose-Rate High-Resolution Transmission Electron Microscopy of Group III – Nitride Electronic Device Structures Using a Direct Electron Detector
80. Imaging of the crystal structure of silicon nitride at 0.8 Ångström resolution
81. Quantification of Displacement Fields from Lattice Images (HREM) and Electron Exit Waves in Nanostructured Composite Oxides
82. Comment on, “On the influence of the electron dose-rate on the HRTEM image contrast”, by Juri Barthel, Markus Lentzen, Andreas Thust, ULTRAM12246 (2016), http://dx.doi.org/10.1016/j.ultramic.2016.11.016
83. Real Time Observation and Characterization of Dislocation Motion, Nitrogen Desorption and Nanopipe Formation in GaN
84. Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED
85. Deformation-Induced Dislocations in 4H-SiC and GaN
86. Sub-Ångstrom high-resolution transmission electron microscopy at 300 keV
87. Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution
88. Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III – Nitride Electronic Devices
89. Observing Catalyst Structures and Dynamics at Atomic-Resolution
90. Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III – Nitride Electronic Devices
91. Metallic impurities in gallium nitride grown by molecular beam epitaxy
92. Electron Microscopy of Heterostructure for Solar Energy Recovery: ZnO Nanowires and Co3O4 Nanoparticles
93. Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
94. Imaging Atomic Processes in Catalysts using a New High-Order Imaged-Corrected Environmental-TEM
95. Low Dose Electron Microscopy of Cobalt Oxide Heterostructures, the Genuine Atomic Structure and Dose Limit
96. P4Coherent Electron Tomography: Dynamics and Shape of Nanomaterials at Atomic Resolution
97. TEM Characterization of Ball Milled CIS and CIGS Nanoparticles
98. Low Dose Electron Microscopy of Interlayer Expanded Molybdenum Disulfide Nanocomposites
99. Low Dose Electron Microscopy of ZnS-Bipy based Hybrid Organic-Inorganic Materials for Energy Applications
100. Yttrium-Ytterbium interdiffusion along a near ∑5 grain boundary at the nm-scale
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