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318 results on '"Alegría, Angel"'

55. Mesoscale Dynamics in Melts of Single-Chain Polymeric Nanoparticles

Author

Arbe, Arantxa, primary, Rubio-Cervilla, Jon, additional, Alegría, Angel, additional, Moreno, Angel J., additional, Pomposo, José A., additional, Robles-Hernández, Beatriz, additional, Malo de Molina, Paula, additional, Fouquet, Peter, additional, Juranyi, Fanni, additional, and Colmenero, Juan, additional

Published
2019
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58. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response.

Author

Miccio, Luis A., Kummali, Mohammed M., Schwartz, Gustavo A., Alegría, Angel, and Colmenero, Juan

Subjects
BROADBAND dielectric spectroscopy, ATOMIC force microscopy, DIELECTRIC properties, SENSITIVITY analysis, CANTILEVERS, FREQUENCY dependent capacitors, MOLECULAR dynamics
Abstract

The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal. [ABSTRACT FROM AUTHOR]

Published
2014
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61. Effect of hydration on the dielectric properties of C-S-H gel.

Author

Cerveny, Silvina, Arrese-Igor, Silvia, Dolado, Jorge S., Gaitero, Juan J., Alegría, Angel, and Colmenero, Juan

Subjects
HYDRATION, BROADBAND dielectric spectroscopy, COLLOIDS, HYDRODYNAMICS, CALCIUM silicates, HYDRATES, LOW temperatures
Abstract

The behavior of water dynamics confined in hydrated calcium silicate hydrate (C-S-H) gel has been investigated using broadband dielectric spectroscopy (BDS; 10-2-106 Hz) in the low-temperature range (110-250 K). Different water contents in C-S-H gel were explored (from 6 to 15 wt%) where water remains amorphous for all the studied temperatures. Three relaxation processes were found by BDS (labeled 1 to 3 from the fastest to the slowest), two of them reported here for the first time. We show that a strong change in the dielectric relaxation of C-S-H gel occurs with increasing hydration, especially at a hydration level in which a monolayer of water around the basic units of cement materials is predicted by different structural models. Below this hydration level both processes 2 and 3 have an Arrhenius temperature dependence. However, at higher hydration level, a non-Arrhenius behavior temperature dependence for process 3 over the whole accessible temperature range and, a crossover from low-temperature Arrhenius to high-temperature non-Arrhenius behavior for process 2 are observed. Characteristics of these processes will be discussed in this work. [ABSTRACT FROM AUTHOR]

Published
2011
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62. On the temperature dependence of the nonexponentiality in glass-forming liquids.

Author

Cangialosi, Daniele, Alegría, Angel, and Colmenero, Juan

Subjects
*GAUSSIAN distribution, *AMORPHOUS substances, *POLYMERS, *RELAXATION phenomena, *STANDARD deviations, *DISTRIBUTION (Probability theory)
Abstract

Using a simple mathematical formalism, we show that temperature dependent nonexponential relaxation found in glass-forming liquids and amorphous polymers, often resulting in a decrease in the stretching exponent when decreasing temperature, can be suitably described assuming the combination of an intrinsic stretched response and the existence of temperature independent heterogeneities. The effect of the latter is incorporated by assuming a Gaussian distribution of Vogel temperatures. Comparison with experimental data of a large number of glass formers showed that this approach is able to quasiquantitatively describes the temperature dependence of the stretching exponent using the width of the distribution as the single fitting parameter. According to this approach, the rapidity of the decrease in the stretching exponent with decreasing temperature depends not only on the magnitude of the standard deviation of Vogel temperatures but also on the value of the intrinsic stretching exponent and on the fragility of the glass former. The latter result is able to rationalize, at least partially, the empirical correlation between the fragility and the stretching exponent at Tg. [ABSTRACT FROM AUTHOR]

Published
2009
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63. Dielectric relaxation of polychlorinated biphenyl/toluene mixtures: Component dynamics.

Author

Cangialosi, Daniele, Alegría, Angel, and Colmenero, Juan

Subjects
*MIXTURES, *DIELECTRIC relaxation, *POLYCHLORINATED biphenyls, *TOLUENE, *MOLECULAR dynamics
Abstract

The dynamics of homogenous polychlorinated biphenyl (PCB54)/toluene mixtures have been investigated by means of broadband dielectric spectroscopy. The mixture presents dynamical heterogeneity, alike miscible polymer blends, which is manifested with the presence of two relaxational processes. The relatively slow one has been attributed to the motion of PCB54 in the mixture, whereas the relatively fast one was related to the toluene dynamics in the mixture. These results have been interpreted according to the self-concentration concept, first introduced to describe the dynamics of miscible polymer blends, which relies on the limited size of the cooperative length scale in glass-forming liquids. The self-concentration concept has been incorporated in the Adam–Gibbs theory of the glass transition relating the characteristic relaxation time and the length scale for structural relaxation to the configurational entropy. This allowed the determination of the cooperative length scale of PCB54 and toluene both in mixture and alone through the fitting of a single parameter, namely, that connecting the cooperative length scale to the configurational entropy. This length scale resulted to be in the range of 1–2 nm for all systems. Finally, the out-of-equilibrium dynamics of toluene induced by the selective freezing in of PCB54 has been examined and its relation to the Johari–Goldstein relaxation of pure toluene was critically discussed. [ABSTRACT FROM AUTHOR]

Published
2008
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64. Plasticizer effect on the dynamics of polyvinylchloride studied by dielectric spectroscopy and quasielastic neutron scattering.

Author

Zorn, Reiner, Monkenbusch, Michael, Richter, Dieter, Alegría, Angel, Colmenero, Juan, and Farago, Bela

Subjects
PLASTICIZERS, POLYVINYL chloride, BROADBAND dielectric spectroscopy, NEUTRON scattering, NEUTRON spin echoes, DIELECTRIC relaxation
Abstract

We have studied the influence of plasticization on the microscopic dynamics of a glass-forming polymer. For this purpose we studied polyvinylchloride (PVC) with and without the commercially used plasticizer dioctylphthalate (DOP). We used dielectric spectroscopy and inelastic neutron scattering employing the neutron spin echo (NSE) technique. For both kinds of spectra the α relaxation could be consistently described by a model involving a distribution of individual relaxations of the Kohlrausch type. In contrast to earlier studies it turned out that an asymmetric distribution is necessary to fit the data at the lower temperatures investigated here. The shape parameters of the distribution (width, skewness) for PVC and PVC/DOP turned out to coincide when the characteristic relaxation times were the same. This means that the plasticizer only induces a remapping of the temperature dependence of the α relaxation. Comparison of NSE spectra S(Q,t)/S(Q) at different scattering vectors Q gave the result that the slowing down at the structure factor peak Qmax is surprisingly small for PVC while it is in the normal range for PVC/DOP. [ABSTRACT FROM AUTHOR]

Published
2006
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65. Heterogeneous dynamics of poly(vinyl acetate) far above Tg: A combined study by dielectric spectroscopy and quasielastic neutron scattering.

Author

Tyagi, Madhusudan, Alegría, Angel, and Colmenero, Juan

Subjects
*VINYL acetate, *MOLECULAR dynamics, *VINYL polymers, *MOLECULAR relaxation, *NEUTRON scattering, *QUASIELASTIC light scattering, *BROADBAND dielectric spectroscopy
Abstract

We have investigated the dynamics of poly(vinly acetate) using broadband dielectric spectroscopy (DS) covering over 14 decades in frequency up to 20 GHz and high-resolution quasielastic neutron-scattering (QENS) technique. The dielectric results have been interpreted in terms of the phenomenological Kohlrausch–Williams–Watts [G. Williams and D. C. Watts, Trans. Faraday Soc. 66, 80 (1970); F. Alvarez, A. Alegría, and J. Colmenero, Phys. Rev. B 47, 125 (1993)] description. Because of the wide frequency range covered by DS, it provides a precise determination of dynamics over a wide temperature range and it revealed a crossover in polymer dynamics at 387 K through different dielectric parameters, viz., characteristic times, asymmetric shape parameter, and dielectric strength. Moreover, shape parameter is found to be higher in comparison to other typical polymeric systems. The characteristic relaxation times observed by QENS displayed an anomalous dependence of momentum transfer, indicating the possible existence of heterogeneities in the system even at the high temperatures. In addition, spin-lattice relaxation times, T1, were found to be decoupled from dielectric characteristic times. Based on these results, a model was proposed to account for heterogeneities where we consider coexistence of different regions with standard polymeric behavior but with different characteristic times, leading to a distribution of relaxation times. The model is found to account for the anomalous behavior and an inherent shape parameter is found to account for the shape of α relaxation. This model is also found to predict the T variation of T1 characteristic time scales at all temperatures. The origin of the heterogeneous domains is believed to lie in the microstructure of polymer chains. [ABSTRACT FROM AUTHOR]

Published
2005
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69. Dielectric relaxations in poly(glycidyl phenyl ether): Effects of microstructure and cyclic topology

Author

Universitat Politècnica de Catalunya. Departament d'Enginyeria Química, Universitat Politècnica de Catalunya. POL - Polímers Industrials Avançats i Biopolímers Tecnològics, Gambino, Thomas, Martínez de Ilarduya Sáez de Asteasu, Domingo Antxon, Alegría, Angel, Barroso Burjans, Fabienne, Universitat Politècnica de Catalunya. Departament d'Enginyeria Química, Universitat Politècnica de Catalunya. POL - Polímers Industrials Avançats i Biopolímers Tecnològics, Gambino, Thomas, Martínez de Ilarduya Sáez de Asteasu, Domingo Antxon, Alegría, Angel, and Barroso Burjans, Fabienne

Abstract

Cyclic and linear, isoregic and aregic, and isotactic and atactic poly(glycidyl phenyl ether) (PGPE) with molecular weights up to Mw = 5.5 kg/mol are synthesized by ring-opening polymerization of glycidyl phenyl ether. Initiation with tetrabutylammonium fluoride leads to isoregic linear polymers with ~95% regular linkages, and initiation with B(C6F5)3 and B(C6F5)3/water leads to aregic cyclic and linear polymers, respectively, with ~50% regular linkages as quantified by 13C NMR. Local, segmental, and chain dynamics in PGPE is investigated by broadband dielectric spectroscopy (10–2–106 Hz). The ß-relaxation for linear PGPE is separated into two contributions arising from the motions of side groups and end groups with activation energies of 35.4 and 23.8 kJ/mol, respectively. The ß-relaxation process for cyclic PGPE shows the same activation energy as that shown by the side-group contribution in linear PGPE, indicating that topology does not play a key role on the side-group local dynamics. Moreover, cyclic PGPE samples show higher calorimetric and dynamic glass transition temperatures as well as lower dynamic fragility compared to linear chains. Unexpectedly from topological considerations, cyclic PGPE shows low frequency dielectric contributions that can be attributed to short wavelength internal ring motions and that are detectable by dielectric relaxation due to the aregic nature of the rings., Peer Reviewed, Postprint (author's final draft)

Published
2016

70. Mechanisms of aggregate formation in highly-filled simplified industrial nanocomposites

Author

OBERDISSE, Julian, BAEZA, Guilhem, GENIX, ANNE-CAROLINE, Alegría, Angel, Couty, Marc, Aigle, L2c, Laboratoire Charles Coulomb (L2C), and Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS.COND.CM-SCM]Physics [physics]/Condensed Matter [cond-mat]/Soft Condensed Matter [cond-mat.soft], [PHYS.COND.CM-SCM] Physics [physics]/Condensed Matter [cond-mat]/Soft Condensed Matter [cond-mat.soft]
Abstract

International audience; Nanocomposites made of hard inorganic nanoparticles (NPs) embedded in a soft polymer matrix may have rheological properties of interest for various applications, and in particular car tires. These properties depend crucially on the dispersion of the filler NPs, which has been studied in simplified industrial (i.e., without crosslinker and related chemistry) styrene–butadiene nanocomposites with silica filler NPs. We have developed a quantitative structural analysis based on a combination of electron microscopy, Monte Carlo simulations, and small-angle X-ray scattering. It allowed us to establish a global structural model, where primary silica beads are organized within small aggregates, which themselves fill large-scale fractal branches. Experimental parameters have been varied independently, starting with the silica volume fraction si, the matrix composition (percentage of graftable chains), and the chain mass. The grafting density on the silica NPs was shown to be the structure- and rheology-determining parameter, and we will show that a simple mechanism is able to explain the evolution of aggregate size and mass with grafting density. Moreover, dynamical properties have been followed by broadband dielectric spectroscopy (BDS) recently, and the detailed characterization of two high-temperature silica-related processes provided evidence that one of them can be linked to the structural evolution of these nanocomposites. Our work thus suggests that such high-temperature BDS-measurements can be used to detect reorganizations in structurally complex silica nanocomposites.Baeza et al, Macromolecules 2013, ibid 2013, ACS Macro Letters 2014, Soft Matter 2014

Published
2014

75. Spectroscopie diélectrique par Microscopie à force électrostatique : application à l’étude de la dynamique des polymères nanostructurés

Author

Riedel, Clément, Arinero, Richard, LEVEQUE, Gérard, Tordjeman, Philippe, Ramonda, Michel, Schwartz, Gustavo Ariel, Alegría, Angel, Colmenero, Juan, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Université de Montpellier (UM), Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2011

76. Influence of Solvent on Poly(2-(Dimethylamino)Ethyl Methacrylate) Dynamics in Polymer-Concentrated Mixtures: A Combined Neutron Scattering, Dielectric Spectroscopy, and Calorimetric Study

Author

Goracci, Guido, primary, Arbe, Arantxa, additional, Alegría, Angel, additional, García Sakai, Victoria, additional, Rudić, Svemir, additional, Schneider, Gerald J., additional, Lohstroh, Wiebke, additional, Juranyi, Fanni, additional, and Colmenero, Juan, additional

Published
2015
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78. Imaging NanoDielectrics with Electrostatic Force Microscopy

Author

Arinero, Richard, Riedel, Clément, Schwartz, Gustavo Ariel, Israeloff, N. E., Alegría, Angel, Tordjeman, Philippe, Colmenero, Juan, Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Northeastern University [Boston], Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), University of the Basque Country [Bizkaia] ( UPV/EHU ), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2010

79. Imaging the Temperature-frequency Dependence of the Local Dielectric Response of Phase Separated Polymer Films by Means of EFM

Author

Riedel , Clément, Sweeney , R., Israeloff , N. E., Arinero , Richard, Schwartz , Gustavo Ariel, Alegría , Angel, Tordjeman , Philippe, Colmenero , Juan, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Northeastern University [Boston], Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, University of the Basque Country [Bizkaia] (UPV/EHU), Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), and University of the Basque Country [Bizkaia] ( UPV/EHU )

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2010

80. Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy

Author

Schwartz , Gustavo Ariel, Arinero , Richard, Riedel , Clément, Tordjeman , Philippe, Alegría , Angel, Colmenero , Juan, Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), University of the Basque Country [Bizkaia] (UPV/EHU), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), and University of the Basque Country [Bizkaia] ( UPV/EHU )

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2010

81. nanoDielectric Spectroscopy in polymers and soft matter by electrostatic force microscopy (EFM): current status and future developments

Author

Schwartz, Gustavo Ariel, Arinero, Richard, Riedel, Clément, Tordjeman, Philippe, Alegría, Angel, Colmenero, Juan, Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), University of the Basque Country [Bizkaia] ( UPV/EHU ), Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Materials Physics Center CSIC-UPV/EHU and Donostia International Physics Center, San Sebastián, Spain, Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS, [SPI.TRON]Engineering Sciences [physics]/Electronics
Abstract

International audience

Published
2010

84. Study of the Nanoscale Dielectric Relaxation of Polymers by Means of Atomic Force Microscopy

Author

Schwartz , Gustavo Ariel, Arinero , Richard, Riedel , Clément, Tordjeman , Philippe, Alegría , Angel, Colmenero , Juan, Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, University of the Basque Country [Bizkaia] (UPV/EHU), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), and University of the Basque Country [Bizkaia] ( UPV/EHU )

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2009

85. Quantitative mapping of the dielectric constant of thin insulating layers at nanoscale

Author

Riedel, Clément, Arinero, Richard, Tordjeman, Philippe, LEVEQUE, Gérard, Schwartz, Gustavo Ariel, Alegría, Angel, Colmenero, Juan, Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), University of the Basque Country [Bizkaia] ( UPV/EHU ), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2009

86. Quantitative Dielectric Permittivity of Polymers and Polymers blends using electrostatic force microscopy

Author

Schwartz, Gustavo Ariel, Arinero, Richard, Riedel, Clément, Tordjeman, Philippe, Alegría, Angel, Colmenero, Juan, Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), University of the Basque Country [Bizkaia] ( UPV/EHU ), Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2009

87. Quantitative determination of the local dielectric permittivity of ultrathin films at Nanoscale by means of Electrostatic Force Microscopy

Author

Riedel , Clément, Arinero , Richard, Tordjeman , Philippe, Schwartz , Gustavo Ariel, De Oteyza , D. G., Alegría , Angel, Ramonda , Michel, Colmenero , Juan, LEVEQUE , Gérard, Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Donostia International Physics Center - DIPC (SPAIN), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), University of the Basque Country [Bizkaia] ( UPV/EHU ), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Centro de Fisica de Materiales (CFM), Consejo Superior de Investigaciones Científicas [Madrid] (CSIC)-Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), Donostia International Physics Center (DIPC), University of the Basque Country/Euskal Herriko Unibertsitatea (UPV/EHU)-University of the Basque Country/Euskal Herriko Unibertsitatea (UPV/EHU), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU), and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2009

88. Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFM

Author

Riedel , Clément, Arinero , Richard, Tordjeman , Philippe, Ramonda , Michel, LEVEQUE , Gérard, Schwartz , Gustavo Ariel, Alegría , Angel, Colmenero , Juan, Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de mécanique des fluides de Toulouse ( IMFT ), Institut National Polytechnique [Toulouse] ( INP ) -Université Paul Sabatier - Toulouse 3 ( UPS ) -Centre National de la Recherche Scientifique ( CNRS ), Université de Montpellier ( UM ), Centro de Fisica de Materiales ( CFM ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ) -Consejo Superior de Investigaciones Científicas [Spain] ( CSIC ), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea ( UPV/EHU ), University of the Basque Country [Bizkaia] ( UPV/EHU ), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de mécanique des fluides de Toulouse (IMFT), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Université de Montpellier (UM), Centro de Fisica de Materiales (CFM), Universidad del Pais Vasco / Euskal Herriko Unibertsitatea [Espagne] (UPV/EHU)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), and University of the Basque Country [Bizkaia] (UPV/EHU)

Subjects
[SPI]Engineering Sciences [physics], [ SPI ] Engineering Sciences [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2009

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