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We present approaches using stochastic processes for the calculation of line broadening in plasmas. The derivation of model microfield methods (MMM) based on analytic formulations is recalled, as well as an approach using a simulation of the stochastic process. We discuss the possibility of an improvement of the stochastic process by comparing our first results to ab initio particle simulations coupled to a numerical integration of the emitters Schrödinger equation.

Abstract: An overview of several spectral line shapes studies of common interest in astrophysical and laboratory plasmas is presented. For lines dominated by Stark broadening, approaches taking into account the dynamics of numerous perturbers are sometimes required. We briefly recall ab initio simulation techniques and model microfield methods used for such conditions. Together with the impact approximation, such models may also be used for studying the effects on a line profile of a magnetic field of the order of the tesla, allowing the diagnostic of stellar objects or magnetic fusion devices. The problem of the apparent spectral line emitted in a plasma affected by strong fluctuations of the plasma parameters is discussed for the case of optically thin plasmas. [Copyright &y& Elsevier]