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Your search keyword '"Danković, Danijel"' showing total 4 results

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1. A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress.

2. Modeling and PSPICE simulation of NBTI effects in VDMOS transistors

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3. Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method.

4. Lifetime estimation in NBT-stressed p-channel power VDMOSFETS