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1. Silver Metallization for Advanced Interconnects.

Author

Manepalli, Rahul and Stepniak, Frank

Subjects
*SILVER, *MICROELECTRONICS
Abstract

Presents information on a study which examined the reliability of silver and the potential benefits of silver metallization in terms of future trends in microelectronic interconnections. Mechanical and electrical benefits of silver; Reliability test of the corrosion threshold voltage of silver; Experimental details; Results and discussion; Conclusions.

Published
1999
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