1. A Remembrance of David C. Joy, a True Microscopy and Microanalysis Pioneer.
- Author
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Newbury, Dale E. and Varano Casasanta, Cameron
- Subjects
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NANOSCIENCE , *MICROSCOPY , *MATERIALS science , *X-ray microanalysis , *FUEL cell electrodes , *JOY - Abstract
He developed the first practical Monte Carlo electron trajectory simulations to aid SEM image interpretation in support of semiconductor device metrology. It is with a heavy heart that I undertake to write this remembrance of an extraordinary member of the microscopy and microanalysis community, Professor David C. Joy (Figure 1), who passed away on August 10, 2022, at the age of 79. He somehow found time in his extraordinarily busy schedule to help me in my Doctor of Philosophy research to apply the SEM to study the deformation of materials I in situ i , including applying electron channeling patterns/contrast, another SEM topic to which David had already made fundamental contributions. [Extracted from the article] more...
- Published
- 2022
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