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Measurements of beam stability for mid-infrared (IR)-emitting quantum cascade lasers (QCLs) are important for applications that require the beam to travel through air to remote targets, such as free-space communication links. We report beam-quality measurement results of narrow-ridge, 4.6 µm-emitting buried-heterostructure (BH) QCLs fabricated using ICP etching and HVPE regrowth. Beam-quality measurements under QCW operation exhibit M2

Scaling the coherent power of mid-infrared (IR)-emitting quantum cascade lasers (QCLs) to the multi-watt range remains an important objective for applications where the laser beam needs to travel through air to remote targets, such as freespace communication links. For such applications requiring long-range pointing accuracy, measurements of beam stability are also important. We present beam-quality measurement results of narrow-ridge (4-5 μm), 4.6 μm-emitting buriedheterostructure (BH) QCLs. A 40-stage, step-tapered active-region (STA) structure was grown by MOCVD, and ICP etching was used to make deep ridges. InP:Fe was preferentially regrown in the field regions by using an SiO2 mask for ridge etching and Hydride Vapor Phase Epitaxy (HVPE). The HVPE process is attractive for selective regrowth, since high growth rates (0.2-0.3 μm/min) can be utilized, and highly planar top surfaces can readily be obtained. HVPE regrowth has been previously employed for BH devices of MBE-grown QCL ridges, but beam-stability measurements were not reported. HR-coated, 7.5 mm-long devices were measured under QCW operation (100 μsec pulse width, 0.5%-10% duty cycle) – very good beam quality factors, M2 < 1.2, were observed for both 4 μm and 5 μm ridge widths, but the narrower ridge exhibited better pointing stability. Collimated 5 μm-wide BH devices displayed some small degree of centroid motion with increasing power (< 0.125 mrad). This corresponds to a targeting error of ~1.25 cm over a distance of 100 m. Significantly improved lateral-beam stability was observed for narrower ridge width, although at the expense of reduced output power.

Heteroepitaxial growth of orientation-patterned GaP on patterned GaAs template was developed by using hydride vapor phase epitaxy for quasi-phase-matching applications. We present the growth with well-defined periodic boundaries between (001) and (00 1) GaP domains. The GaP layer on planar GaAs was characterized by terahertz time-domain spectroscopy and the conductivity of GaP (0.16 S cm−1) was obtained in terahertz range.

Heteroepitaxial growth of orientation‐patterned (OP) GaP (OP‐GaP) on wafer‐bonded OP‐GaAs templates is investigated by low‐pressure hydride vapor phase epitaxy for exploiting the beneficial low two ...

Quasi-phase-matched orientation-patterned GaP (OP-GaP) is an attractive technology for achieving mid-IR and terahertz (THz) radiation enabled by nonlinear frequency conversion, because of its low two-photon absorption (2PA) down to 1 pm. High crystalline quality of OP-GaP template and subsequent thick layer growth is required to exploit the benefit of low 2PA of GaP pumped with short wavelength lasers [1]. In this work, we present the development of heteroepitaxial growth of OP-GaP on wafer fused OP-GaAs template with high growth rate and good domain fidelity. The conductivity of the GaP grown on planar GaAs was investigated in the THz region.