1. Application of High-Frequency EPR Spectroscopy for the Identification and Separation of Nitrogen and Vanadium Sites in Silicon Carbide Crystals and Heterostructures
- Author
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M. V. Muzafarova, N. G. Romanov, A. S. Gurin, Pavel G. Baranov, A. G. Badalyan, A. D. Krivoruchko, R. A. Babunts, I. V. Ilyin, and E. V. Edinach
- Subjects
010302 applied physics ,Materials science ,Spectrometer ,Analytical chemistry ,Vanadium ,chemistry.chemical_element ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,law.invention ,Crystal ,chemistry.chemical_compound ,chemistry ,law ,Impurity ,0103 physical sciences ,Silicon carbide ,Continuous wave ,0210 nano-technology ,Electron paramagnetic resonance ,Spectroscopy - Abstract
The advantage of the high-frequency spectroscopy of electron paramagnetic resonance (EPR) for the identification of nitrogen donors and a deep compensating vanadium impurity in various crystallographic positions of the silicon-carbide crystal is shown. Measurements are performed using a new generation EPR spectrometer operating in the continuous wave and pulsed modes at frequencies of 94 and 130 GHz in a wide range of magnetic fields (–7–7 T) and temperatures (1.5–300 K). A magneto-optical closed-cycle cryogenic system (Spectormag PT), highly stable generators (94 and 130 GHz), and a cavity-free system for supplying microwave power to the sample are used.
- Published
- 2020
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