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Deep-Level Defects in AlN Single Crystals: EPR Studies
- Source :
- Materials Science Forum. :1195-1198
- Publication Year :
- 2010
- Publisher :
- Trans Tech Publications, Ltd., 2010.
-
Abstract
- Electron paramagnetic resonance (EPR) at X-band (9.4 GHz) and Q-band (35 GHz) have been used to study defects in two samples of AlN monocrystals, grown by a sublimation sandwich method. These investigations reveal the presence of Fe2+ impurities in the reddish sample. The spectra of substitutional Fe2+ are highly anisotropic and could be observed even up to the room temperature. After illumination the signals showing the DX behavior were detected in the same sample. We assume these signals to arise due to the presence of the shallow donor center namely the isolated substitutional oxygen ON occupying the nitrogen position. In the second slightly amber-coloured sample EPR measurements before and after X-ray showed the presence of a deep-donor center which was assumed to be nitrogen vacancy VN. Based on thermoluminescence measurements the depth of the level was estimated to 0.45-0.5 eV.
- Subjects :
- Sublimation sandwich method
Materials science
Mechanical Engineering
Analytical chemistry
Condensed Matter Physics
Thermoluminescence
Spectral line
law.invention
Mechanics of Materials
Impurity
law
Vacancy defect
General Materials Science
Anisotropy
Electron paramagnetic resonance
Shallow donor
Subjects
Details
- ISSN :
- 16629752
- Database :
- OpenAIRE
- Journal :
- Materials Science Forum
- Accession number :
- edsair.doi...........8cc7f105a1ce3be759672e6d2848d40a
- Full Text :
- https://doi.org/10.4028/www.scientific.net/msf.645-648.1195