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Deep-Level Defects in AlN Single Crystals: EPR Studies

Authors :
Pavel G. Baranov
V. A. Soltamov
Alexandra A. Soltamova
I. V. Ilyin
E. N. Mokhov
V. A. Khramtsov
Source :
Materials Science Forum. :1195-1198
Publication Year :
2010
Publisher :
Trans Tech Publications, Ltd., 2010.

Abstract

Electron paramagnetic resonance (EPR) at X-band (9.4 GHz) and Q-band (35 GHz) have been used to study defects in two samples of AlN monocrystals, grown by a sublimation sandwich method. These investigations reveal the presence of Fe2+ impurities in the reddish sample. The spectra of substitutional Fe2+ are highly anisotropic and could be observed even up to the room temperature. After illumination the signals showing the DX behavior were detected in the same sample. We assume these signals to arise due to the presence of the shallow donor center namely the isolated substitutional oxygen ON occupying the nitrogen position. In the second slightly amber-coloured sample EPR measurements before and after X-ray showed the presence of a deep-donor center which was assumed to be nitrogen vacancy VN. Based on thermoluminescence measurements the depth of the level was estimated to 0.45-0.5 eV.

Details

ISSN :
16629752
Database :
OpenAIRE
Journal :
Materials Science Forum
Accession number :
edsair.doi...........8cc7f105a1ce3be759672e6d2848d40a
Full Text :
https://doi.org/10.4028/www.scientific.net/msf.645-648.1195