1. Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design
- Author
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Wuhua Li, Haoze Luo, Frede Blaabjerg, Francesco Iannuzzo, and Xiangning He
- Subjects
010302 applied physics ,Engineering ,business.industry ,020208 electrical & electronic engineering ,02 engineering and technology ,Test method ,Insulated-gate bipolar transistor ,Condensed Matter Physics ,Flyback diode ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Power (physics) ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,Junction temperature ,Commutation ,Igbt inverter ,Electrical and Electronic Engineering ,Current (fluid) ,Safety, Risk, Reliability and Quality ,business ,Simulation - Abstract
This paper presents a high-power IGBT testing platform for uneven temperature conditions and its design criteria. Considering the influence of layout parasitic parameters on the measurement results, commutation rules and independent junction temperature control, a universal high-power switching characterization platform is built and operated. Importantly, it is capable of 3.6 kA current level test requirement, which can cover the largest current level for the state-of-the-art IGBT modules. To improve the test accuracy of double pulse test method, a compensation algorithm is proposed to eliminate the circuit power loss under high current test conditions. Moreover, in order to simulate the uneven junction temperature effects occurring in real life, the junction temperatures of inspected IGBT and freewheeling diode are controlled independently. Quantitative analyses of the switching characteristics for junction temperatures up to 125 °C are performed.
- Published
- 2017
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