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Antiferroelectric thin films have attracted blooming interest due to their potential application in energy storage areas. Pb(1−3x/2)LaxHfO3 (PLHO-x, x = 0–0.05) thin films were fabricated on Pt(111)/TiO2/SiO2/Si substrates via the chemical solution deposition method. The x-ray diffraction and high-resolution transmission electron microscopy results show that the doping of La3+, which has a smaller ion radius, leads to a slight decrease in the lattice constant and unit cell volume, which can induce the lattice distortion. In addition, the dielectric and polarization properties indicate that with an increase in the temperature or La3+ content, the antiferroelectric (AFE) I phase can transform into an AFE II phase, exhibiting a slimmer P–E loop with enhanced switching field and more pronounced polarization dispersion. Notably, PLHO-0.04 showcases excellent energy storage performance (55 J/cm3, at 2.8 MV/cm). This material also exhibits good thermal, frequency, and fatigue stability. These results suggest that the energy storage performance of PbHfO3-based films can be enhanced through the phase structure design, presenting a valuable approach to fulfill the growing demand for advanced energy storage devices. [ABSTRACT FROM AUTHOR]

PbZrO3 has been broadly considered as a prototypical antiferroelectric material for high-power energy storage. A recent theoretical study suggests that the ground state of PbZrO3 is threefold-modulated ferrielectric, which challenges the generally accepted antiferroelectric configuration. However, such a novel ferrielectric phase was predicted only to be accessible at low temperatures. Here, we successfully achieve the room-temperature construction of the strongly competing ferrielectric and antiferroelectric state by strain-mediated phase separation in PbZrO3/SrTiO3 thin film. We demonstrate that the phase separation occurs spontaneously in quasi-periodic stripe-like patterns under a compressive misfit strain and can be tailored by varying the film thickness. The ferrielectric phase strikingly exhibitsa threefold modulation period with a nearly up-up-down configuration, which could be stabilized and manipulated by the formation and evolution of interfacial defects under applied strain. The present results construct a fertile ground for further exploring the physical properties and applications based on the novel ferrielectric phase. There is a desire to know how the threefold ferrielectric coexists with the antiferroelectric phase. Here, the authors realize a threefold-modulated ferrielectric phase regulated by strain-mediated phase separation in PbZrO3 thin film. [ABSTRACT FROM AUTHOR]

Polarization switching and energy storage properties of highly (100) oriented antiferroelectric (AFE) (Pb,La)(Zr,Ti)O3 thin films (≤250 nm) deposited via a sol-gel process with both LaNiO3 and Pt top electrodes were investigated. By using LaNiO3 top electrodes, the energy density as well as energy efficiency can be enhanced by 4.6 J/cm3 and 11%, respectively. Furthermore, the films with LaNiO3 top electrodes are more capable of providing high energy density over a wide temperature regime above room temperature compared to Pt. This work clearly highlights that oxide top electrodes can greatly improve the energy storage performance of antiferroelectric thin film capacitors. [ABSTRACT FROM AUTHOR]

The effect of residual stress on energy storage property was investigated for a series of PbZrO3 thin films on SrTiO3 and Si substrates. Compressive or tensile residual stress influences the critical electric field EA for the ferroelectric-to-antiferroelectric phase transition, thus for films with (110)/(101) orientation, energy density W of films on SrTiO3 is 38% larger than films on Si; in contrast, (001)-oriented PbZrO3 films on SrTiO3 show slightly smaller W compared to films on Si. We conclude that the different responses of W to stress are related to the different constrain states in films with different orientations. [ABSTRACT FROM AUTHOR]

In this work, Pb 1−3 x /2 La x ZrO 3 (x = 0–0.12) (PLZ- x) antiferroelectric thin films were fabricated on Pt(111)/TiO 2 /SiO 2 /Si substrates using chemical solution method. Smaller cations (La3+) and vacancies were introduced into A-sites of perovskite structure to construct chemical pressure. According to phenomenological theory, chemical pressure can increase the energy barrier between antiferroelectric (AFE) and ferroelectric (FE) phase, and enhance antiferroelectricity of the system. As a result, a large energy storage density (W re) of 23.1 J cm−3 and high efficiency (η) of 73% were obtained in PLZ-0.10 films, while PLZ-0 films displayed lower W re (15.1 J cm−3) and η (56%). More importantly, PLZ-0.10 films exhibited an excellent cycling stability with a variation of ˜2% after 1 × 108 cycles. The results demonstrate that heavily La-doped PbZrO 3 films with high energy storage density, high efficiency and excellent cycling stability can be considered as potential candidates for energy storage applications. [ABSTRACT FROM AUTHOR]

Highly (001)-oriented pure PbZrO 3 (PZO) films and Sn-substituted PZO films are deposited on (001)-LaNiO 3 buffered SiO 2 /Si substrates by RF magnetron sputtering. Different Sn-substituted PbZrO 3 films (PbZr 1-x Sn x O 3 , x = 0%, 3%, 5%, 10%) with orthorhombic anti-ferroelectric phase are fabricated. The effects of Sn substitution on structure and energy performance have been investigated in detail. The switching electric fields are enlarged and energy loss is lowered by Sn substitution. Recoverable energy density (Wr) of 14.8 ± 0.2 J/cm 3 and energy efficiency (η) of 71.2 ± 0.5% at 900 kV/cm are obtained in 5% Sn-substituted PZO film (~ 360 nm). Furthermore, with thicker thickness of ~ 650 nm, Wr and η can be further improved. The Sn-substituted PZO film is believed to be an improved material for applications in energy storage systems and 5% Sn-substituted PZO film exhibits the highest Wr and η in this work. [ABSTRACT FROM AUTHOR]

[Display omitted] • The superior energy storage properties of Pb 0.925 La 0.05 Zr 1- x Ti x O 3 antiferroelectric thin films in Zr rich were obtained. • In Zr-rich region, the saturation polarization strengthens of PLZT with increasing Ti content due to change of ion-radius, and the switching field decreased which means the enhancement of ferroelectricity. • The co-doped PLZT films possessed higher breakdown strength, which greatly optimized the energy storage properties. • The high recoverable energy density of 49.7 J/cm3 and efficiency of 54% were obtained in the Pb 0.925 La 0.05 Zr 0.985 Ti 0.015 O 3 film. Pb 0.925 La 0.05 Zr 1- x Ti x O 3 (PLZT, x = 0.5%∼5.5%) thin film were fabricated on Pt(1 1 1)/TiO 2 /SiO 2 /Si substrates by sol–gel method. In the Zr-rich region, the saturation polarization strengthens with increasing Ti content due to the change of ion-radius. On the other hand, the switching field decreases, which means the enhancement of ferroelectricity. The phase structure and polarization of the films can be tuned by a small amount of Ti doping, and then the energy storage characteristics of the thin films can be modulated. The results showed that a large energy storage density (W rec) of 49.7 J/cm3 and efficiency (η) of 54% were achieved in the x = 1.5%. Moreover, the x = 1.5% sample displayed excellent cycling stability up to 1 × 106 cyclings, which demonstrated that La and Ti co-doped films can be considered as potential candidates for future energy storage devices. [ABSTRACT FROM AUTHOR]