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To obtain high energy storage density in ferroelectric films, polarization and breakdown field Eb are two crucial factors. The inversely coupled relationship between polarization and Eb is commonly observed and it remains a challenge to realize high E b without deteriorating polarization. Selecting a suitable element doping should largely enhance the Eb since of the optimization of microstructures as well as the decrease in defects, meanwhile the doping should induce extra polarization contribution from lattice distortion. In this work, we reported that Eb can be largely enhanced via Mn doping in BaBi4Ti4O15 thin films due to grain refining, densification, and oxygen vacancy reduction. Interestingly, the polarization is not deteriorated since of the Mn doping effect induced extra polarization from the lattice distortion. Consequently, an ultrahigh energy storage density of 96 J/cm3 with a high efficiency of 76.6% was achieved in BaBi4Ti3.95Mn0.05O15 thin films with excellent stability and reliability. This work will provide a simple and effective route to improve the energy storage in dielectric capacitors. [ABSTRACT FROM AUTHOR]

Lead-free Na0.5Bi0.5TiO3 (NBT) exhibiting large polarization and a high Curie temperature can be considered as a promising candidate for dielectric capacitors. The large polarization switching hysteresis and low breakdown field, however, restrict the performance optimization. Herein, epitaxial NBT-based high-entropy Na0.5Bi0.5Ti0.7Hf0.1Zr0.1Sn0.1O3 (NBTHZS) films are designed and prepared by solution-based processing. Compared with the NBT film, the polarization switching hysteresis is depressed and the breakdown field is significantly improved for the NBTHZS film due to the high-entropy effects. Therefore, the NBTHZS film achieves a ∼16 times enhancement of energy density (from 5.1 J/cm3 of the NBT film to 81 J/cm3 of the NBTHZS film) and a high efficiency of 74.1% as well as an excellent performance reliability. The results shed light on enhancing dielectric energy storage properties of NBT-based films by forming high-entropy structures. [ABSTRACT FROM AUTHOR]

Flexible Ba2Bi4Ti5O18 and BiFe0.93Mn0.07O3/Ba2Bi4Ti5O18 heterostructure thin-film capacitors were deposited onto LaNiO3 buffered fluorophlogopite mica substrates using a cost-effective all-solution chemical solution deposition method. The Ba2Bi4Ti5O18 film showed a high recoverable energy storage density (Ure) of 41.2 J/cm3 and efficiency (η) of 79.1%. The BiFe0.93Mn0.07O3/Ba2Bi4Ti5O18 film showed improved energy storage properties with an ultrahigh Ure of 52.6 J/cm3 and η of 75.9% due to its enhanced breakdown field strength and polarization. Meanwhile, both films showed good mechanical flexibility, excellent fatigue endurance up to 5 × 108 cycles, and excellent thermal stability over a wide temperature range from room temperature to 160 °C. These results indicate that the lead-free, flexible Ba2Bi4Ti5O18 and BiFe0.93Mn0.07O3/Ba2Bi4Ti5O18 heterostructure thin film capacitors show promise in the field of flexible electronics. [ABSTRACT FROM AUTHOR]

Environmentally benign Bi3.25La0.75Ti3O12 (BLTO) thin film capacitors were prepared by a cost effective chemical solution deposition method for high energy density storage device applications. Low annealing temperature annealed BLTO thin films showed very slim hysteresis loops with high maximum and small remnant polarization values. Increasing the applied electric field to 2040 kV/ cm, the optimized BLTO thin films show a high recoverable energy density of 44.7 J/cm3 and an energy efficiency of 78.4% at room temperature. Additionally, the BLTO thin film capacitors exhibited excellent fatigue endurance after 4x108 cycles and a good thermal stability up to 140°C, proving their strong potential for high energy density storage and conversion applications. [ABSTRACT FROM AUTHOR]