1. Development of a Scanning X-ray Fluorescence Microscope Using Size-Controllable Focused X-ray Beam from 50 to 1500nm.
- Author
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Matsuyama, Satoshi, Mimura, Hidekazu, Yumoto, Hirokatsu, Katagishi, Keiko, Handa, Soichiro, Shibatani, Akihiko, Sano, Yasuhisa, Yamamura, Kazuya, Endo, Katsuyoshi, Mori, Yuzo, Nishino, Yoshinori, Tamasaku, Kenji, Yabashi, Makina, Ishikawa, Tetsuya, and Yamauchi, Kazuto
- Subjects
FLUORESCENCE ,X-rays ,OPTICS ,SCANNING electron microscopy ,ELECTRON beams - Abstract
In scanning X-ray microscopy, focused beam intensity and size are very important from the viewpoints of improvements of various performances such as sensitivity and spatial resolution. The K-B mirror optical system is considered to be the most promising method for hard X-ray focusing, allowing highly efficient and energy-tunable focusing. We developed focusing optical system using K-B mirrors where the focused beam size is controllable within the range of 50 – 1500 nm. The focused beam size and beam intensity can be adjusted by changing the source size, although beam intensity and size are in a trade-off relationship. This controllability provides convenience for microscopy application. Diffraction limited focal size is also achieved by setting the source size to 10 μm. Intracellular elemental mappings at the single-cell level were performed to demonstrate the performance of the scanning X-ray fluorescence microscope equipped with the optical system at the BL29XUL of SPring-8. We will show magnified elemental images with spatial resolution of ∼70 nm. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]
- Published
- 2007
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