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Development of a Scanning X-ray Fluorescence Microscope Using Size-Controllable Focused X-ray Beam from 50 to 1500nm.
- Source :
- AIP Conference Proceedings; 2007, Vol. 879 Issue 1, p1325-1328, 4p, 6 Diagrams, 3 Charts
- Publication Year :
- 2007
-
Abstract
- In scanning X-ray microscopy, focused beam intensity and size are very important from the viewpoints of improvements of various performances such as sensitivity and spatial resolution. The K-B mirror optical system is considered to be the most promising method for hard X-ray focusing, allowing highly efficient and energy-tunable focusing. We developed focusing optical system using K-B mirrors where the focused beam size is controllable within the range of 50 – 1500 nm. The focused beam size and beam intensity can be adjusted by changing the source size, although beam intensity and size are in a trade-off relationship. This controllability provides convenience for microscopy application. Diffraction limited focal size is also achieved by setting the source size to 10 μm. Intracellular elemental mappings at the single-cell level were performed to demonstrate the performance of the scanning X-ray fluorescence microscope equipped with the optical system at the BL29XUL of SPring-8. We will show magnified elemental images with spatial resolution of ∼70 nm. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]
- Subjects :
- FLUORESCENCE
X-rays
OPTICS
SCANNING electron microscopy
ELECTRON beams
Subjects
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 879
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 23923726
- Full Text :
- https://doi.org/10.1063/1.2436308