9 results on '"P. Gall-Borrut"'
Search Results
2. Study of light emission and collection in a transparent dielectric cantilever-based near-field optical probe
- Author
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E.L. Nativel, Raphael Kribich, P. Gall‐Borrut, P. Falgayrettes, B. Mourched, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Térahertz, hyperfréquence et optique (TéHO), and Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
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Histology ,Materials science ,genetic structures ,Physics::Optics ,02 engineering and technology ,Scanning capacitance microscopy ,Pathology and Forensic Medicine ,law.invention ,Scanning probe microscopy ,Optics ,Optical microscope ,law ,0202 electrical engineering, electronic engineering, information engineering ,business.industry ,020206 networking & telecommunications ,021001 nanoscience & nanotechnology ,eye diseases ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Scanning ion-conductance microscopy ,Light emission ,Near-field scanning optical microscope ,sense organs ,0210 nano-technology ,business ,Non-contact atomic force microscopy ,Vibrational analysis with scanning probe microscopy - Abstract
International audience; We report the design of a new type of scanning near-field optical microscopy probes combining the advantages of both tapered optical fibres type and cantilever type commercial scanning near-field optical microscopy probes. The material is an organomineral synthesized by the sol-gel method. This material matches mechanical and optical performances for such a scanning near-field optical microscopy probe fabrication. Numerical calculations were carried out using finite element method in order to study the optical transmission of the probe in emission and collection modes. The influence of the probe geometry on the intensity distribution in the vicinity of the aperture and in the extremity of the cantilever is studied in details.
- Published
- 2016
3. Near-field microscopy and fluorescence spectroscopy: application to chromosomes labelled with different fluorophores
- Author
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C. Bisbal, P. Gall-Borrut, T. Salehzada, Laurent Mahieu-Williame, L. Costa, P. Falgayrettes, L. Nativel, Centre de Recherche en Acquisition et Traitement de l'Image pour la Santé (CREATIS), Université Jean Monnet [Saint-Étienne] (UJM)-Hospices Civils de Lyon (HCL)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Centre National de la Recherche Scientifique (CNRS)-Institut National de la Santé et de la Recherche Médicale (INSERM), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Térahertz, hyperfréquence et optique (TéHO), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Centre d'Etude et de Recherche Multimodal Et Pluridisciplinaire en imagerie du vivant (CERMEP - imagerie du vivant), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-CHU Grenoble-Hospices Civils de Lyon (HCL)-CHU Saint-Etienne-Université Jean Monnet [Saint-Étienne] (UJM)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), and Institut de génétique humaine (IGH)
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Méthodes et systèmes en IRM et optique ,Histology ,Materials science ,genetic structures ,Physics::Optics ,02 engineering and technology ,Fluorescence spectroscopy ,Pathology and Forensic Medicine ,03 medical and health sciences ,Optics ,Microscopy ,Image Processing, Computer-Assisted ,categₛt2i ,[INFO.INFO-IM]Computer Science [cs]/Medical Imaging ,Fluorescence microscope ,Chromosomes, Human ,Humans ,ComputingMilieux_MISCELLANEOUS ,Fluorescent Dyes ,030304 developmental biology ,Fluorescence loss in photobleaching ,[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] ,0303 health sciences ,Total internal reflection fluorescence microscope ,Staining and Labeling ,business.industry ,reseauₙational ,021001 nanoscience & nanotechnology ,imagerie_RMNₒptique ,Chromatin ,Spectrometry, Fluorescence ,Light sheet fluorescence microscopy ,Near-field scanning optical microscope ,Fluorescence cross-correlation spectroscopy ,sense organs ,0210 nano-technology ,business - Abstract
We have coupled a spectrophotometer with a scanning near-field optical microscope to obtain, with a single scan, simultaneously scanning near-field optical microscope fluorescence images at different wavelengths as well as topography and transmission images. Extraction of the fluorescence spectra enabled us to decompose the different wavelengths of the fluorescence signals which normally overlap. We thus obtained images of the different fluorescence emissions of acridine orange bound to single or double stranded nucleic acids in human metaphase chromosomes before and after DNAse I or RNAse A treatment. The analysis of these images allowed us to visualize some specific chromatin areas where RNA is associated with DNA showing that such a technique could be used to identify multiple components within a cell.
- Published
- 2010
4. MOEMS for near field optical microscopy: from conception to fabrication process challenges
- Author
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Benoit Belier, A. Tsigara, P. Gall-Borrut, P. Falgayrettes, F. Maillard, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Térahertz, hyperfréquence et optique (TéHO), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut d'électronique fondamentale (IEF), and Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
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Silicon photonics ,Materials science ,Fabrication ,business.industry ,Near-field optics ,Photodetector ,Waveguide (optics) ,law.invention ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Optics ,Optical microscope ,law ,Near-field scanning optical microscope ,Micro-Opto-Electro-Mechanical Systems ,business ,ComputingMilieux_MISCELLANEOUS - Abstract
We explain and detail how the specifications of the concerned Scanning Near Field Optical Microscope (SNOM) MOEMS probe determine its structure and fabrication process specifications. The probe consists of a cantilever with a pyramidal tip and a waveguide coupled to a miniature photodetector, the set being integrated on an SU8 chip. The steps of the batch fabrication process are described. The fabricated probes are used as AFM/SNOM sensor allowing the acquisition of both topographic and optical images. We show images obtained on a standard sample. Mechanical characteristics of the fabricated probes are also given.
- Published
- 2015
5. MMIC's characterization by very near-field technique
- Author
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P. Falgayrettes, P. Gall-Borrut, M. Castel, D. Gasquet, M. Marchetti, Michel Castagne, L. Nativel, Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), and Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS)
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Engineering ,Near and far field ,02 engineering and technology ,PROBES ,law.invention ,Bluetooth ,GHZ ,law ,Hardware_INTEGRATEDCIRCUITS ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,Electrical and Electronic Engineering ,Monolithic microwave integrated circuit ,Electronic circuit ,Cmos power amplifier ,business.industry ,high-resolution imaging ,PLANAR MICROWAVE CIRCUITS ,MMICs EMC ,020206 networking & telecommunications ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Atomic and Molecular Physics, and Optics ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Electronic, Optical and Magnetic Materials ,Characterization (materials science) ,RESOLUTION ,very near-field measurements ,Optoelectronics ,0210 nano-technology ,business ,Microwave ,Planar microwave circuits - Abstract
This paper shows a method to characterize microwave circuits using a near-field scanning microscope. Applied on various samples, it shows good resolution and weak disturbance for ICs operating with very common microwave components. Here, it is applied in an industrial surrounding to characterize the Bluetooth CMOS power amplifier. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 209–213, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20096
- Published
- 2004
6. A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy
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Michel Castagne, Jean-Pierre Fillard, P. Gall-Borrut, J. L. Weyher, and Jacques Bonnafe
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Total internal reflection ,Range (particle radiation) ,Photon ,Atomic force microscopy ,Chemistry ,business.industry ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,law.invention ,Optics ,Semiconductor ,law ,Wafer ,Scanning tunneling microscope ,business ,Instrumentation ,Beam (structure) - Abstract
Processed InP and GaAs surfaces are studied by synchronous atomic-force (AFM) and photon scanning tunneling microscopy (PSTM). A beam injection system at 1.06 μm in the transparency range of semiconductors is described which makes it possible to perform total internal reflection (TIR) without any specific preparation or shaping on standard wafers.
- Published
- 1998
7. Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses
- Author
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P. Gall-Borrut, P. Falgayrettes, Michel Castagne, D. Perret, L. Nativel, B. Drevet, Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), and Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS)
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02 engineering and technology ,Iterative reconstruction ,01 natural sciences ,Light scattering ,Laser beam applications ,Optics ,0103 physical sciences ,medicine ,Optical tomography ,Instrumentation ,010302 applied physics ,Defect characterization ,Experimental study ,medicine.diagnostic_test ,Chemistry ,Scattering ,business.industry ,Resolution (electron density) ,Defect density ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Electronic, Optical and Magnetic Materials ,Characterization (materials science) ,Optical method ,Amorphous material ,Levitation ,Glass ,Tomography ,0210 nano-technology ,business ,Laser beams - Abstract
International audience; A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 102/mm3. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented.
- Published
- 2004
8. Effect of the annealing on the electrical and optical properties of electron beam evaporated ZnO thin films
- Author
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G. Ferblantier, Frédérick Mailly, P. Gall-Borrut, R. Al Asmar, Alain Foucaran, Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), Conception et Test de Systèmes MICroélectroniques (SysMIC), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), and Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)
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Materials science ,Annealing (metallurgy) ,Electrical properties and measurements ,02 engineering and technology ,Dielectric ,01 natural sciences ,Electron beam physical vapor deposition ,Optics ,Ellipsometry ,Electrical resistivity and conductivity ,0103 physical sciences ,Zinc oxide ,Materials Chemistry ,Thin film ,010302 applied physics ,Structural properties ,Optical properties ,business.industry ,Metals and Alloys ,Surfaces and Interfaces ,021001 nanoscience & nanotechnology ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Full width at half maximum ,Optoelectronics ,0210 nano-technology ,business ,Refractive index - Abstract
International audience; Zinc oxide thin films have been grown on (100)-oriented silicon substrate at a temperature of 100 °C by reactive e-beam evaporation. Structural, electrical and optical characteristics have been compared before and after annealing in air by measurements of X-ray diffraction, real and imaginary parts of the dielectric coefficient, refractive index and electrical resistivity. X-ray diffraction measurements have shown that ZnO films are highly c-axis-oriented with a full width at half maximum (FWMH) lower than 0.5°. The electrical resistivity increases from 10-2 Ω cm to reach a value about 109 H cm after annealing at 750 °C. The FWHM decreases after annealing treatment, which proves the crystal quality improvement. Ellipsometer measurements show the improvement of the refractive index and the real dielectric coefficient after annealing treatment at 750 °C of the ZnO films evaporated by electron beam. Atomic force microscopy shows that the surfaces of the electron beam evaporated ZnO are relatively smooth. Finally, a comparative study on structural and optical properties of the electron beam evaporated ZnO and the rf magnetron deposited one is discussed.
- Published
- 2005
9. Silicon technology-based micro-systems for atomic force microscopy/photon scanning tunnelling microscopy
- Author
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Michel Castagne, P. Gall-Borrut, Christian Bergaud, P. Falgayrettes, P. Temple-Boyer, and B. Belier
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Kelvin probe force microscope ,Histology ,Materials science ,business.industry ,Scanning confocal electron microscopy ,Atomic force acoustic microscopy ,Scanning capacitance microscopy ,Conductive atomic force microscopy ,Pathology and Forensic Medicine ,Optics ,Scanning ion-conductance microscopy ,business ,Non-contact atomic force microscopy ,Photoconductive atomic force microscopy - Abstract
We developed silicon nitride cantilevers integrating a probe tip and a wave guide that is prolonged on the silicon holder with one or two guides. A micro-system is bonded to a photodetector. The resulting hybrid system enables us to obtain simultaneously topographic and optical near-field images. Examples of images obtained on a longitudinal cross-section of an optical fibre are shown.
- Published
- 2001
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