1. Slot-loaded patches with a switching mechanism to extend the scanning range of a phased array subject to scan blindness
- Author
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Renaud Loison, Isabelle Le Roy-Naneix, Christian Renard, Aurelien Ayissi Manga, Raphaël Gillard, Institut d'Électronique et des Technologies du numéRique (IETR), Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), THALES Airborne Systems [Elancourt], THALES [France], Université de Nantes (UN)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), THALES, Institut d'Electronique et de Télécommunications de Rennes ( IETR ), Université de Nantes ( UN ) -Université de Rennes 1 ( UR1 ), Université de Rennes ( UNIV-RENNES ) -Université de Rennes ( UNIV-RENNES ) -Institut National des Sciences Appliquées - Rennes ( INSA Rennes ) -CentraleSupélec-Centre National de la Recherche Scientifique ( CNRS ), THALES SYSTEMES AEROPORTES, Laboratoire de Génie Electrique de Grenoble ( G2ELab ), Université Joseph Fourier - Grenoble 1 ( UJF ) -Institut polytechnique de Grenoble - Grenoble Institute of Technology ( Grenoble INP ) -Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Centre National de la Recherche Scientifique ( CNRS ) -Université Grenoble Alpes ( UGA ) -Université Joseph Fourier - Grenoble 1 ( UJF ) -Institut polytechnique de Grenoble - Grenoble Institute of Technology ( Grenoble INP ) -Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Centre National de la Recherche Scientifique ( CNRS ) -Université Grenoble Alpes ( UGA ), and Nantes Université (NU)-Université de Rennes 1 (UR1)
- Subjects
Computer science ,Phased array ,[ INFO.INFO-NI ] Computer Science [cs]/Networking and Internet Architecture [cs.NI] ,Impedance matching ,Topology (electrical circuits) ,02 engineering and technology ,Antenna array ,[INFO.INFO-NI]Computer Science [cs]/Networking and Internet Architecture [cs.NI] ,Optics ,0202 electrical engineering, electronic engineering, information engineering ,Range (statistics) ,coupling ,Electrical and Electronic Engineering ,Coupling ,business.industry ,020208 electrical & electronic engineering ,020206 networking & telecommunications ,Condensed Matter Physics ,Atomic and Molecular Physics, and Optics ,[ SPI.TRON ] Engineering Sciences [physics]/Electronics ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Electronic, Optical and Magnetic Materials ,Mechanism (engineering) ,antenna array ,Proof of concept ,scan blindness ,business - Abstract
International audience; This article presents a novel solution to extend the scanning range of a cavity-backed stacked-patch phased array whose performances are limited by scan blindness. Two main aspects are investigated. The first section is a thorough description of the scan blindness mechanism and the associated mutual coupling scheme occurring in the reported array. The second section introduces a revised array topology that allows extending the scanning range up to the blind angle. The article focuses on the proof of concept of the proposed solution, which is based on the switching between two operating modes of the structure, each one covering a part of a globally wider scanning range. In the present case, the scanning capability of the array has been extended by 10 degrees in the scanning plane of interest. Besides, the restored impedance matching allows for a 2 dBi gain improvement at the scan blindness angle.
- Published
- 2018