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International audience; We study the inter-well excitonic coupling in a series of In0.17Ga0.83N/GaN Double QWs (DQWs) with varying central barrier width. We observe the switching between indirect IX (inter-well) and direct DX (intra-well) excitons, for thin barriers (2 nm or less), depending on the exciton density. This density is controlled, in cw-PL, by the pumping laser power density (LPD). Above a certain threshold, we observe a sudden change of the PL blue-shift, when switching from IXs (large slope) to DXs (weak slope). In time-resolved PL, the exciton density evolves as the PL intensity decays with time, and the switching occurs from DXs to IXs, after a certain characteristic time. The decay time of IXs is of the order of hundreds of s, whereas the decay time of DXs is shorter by three orders of magnitude. The switching thresholds in both cw- and TR-PL present clear exponential dependences upon the width of the central barrier, which demonstrates the role of carrier tunneling in the overall switching processes. The described effects were studied at T10K but we found that IXs persist up to T=300K pointing out the importance of large exciton biding energy in nitride QWs.

Studies of internal electric fields in GaN/AlxGa1-xN (3 nm/4 nm) multi-quantum-wells (MQWs) with x = 0.25, 0.5, and 1 are presented. The structures were grown by plasma-assisted molecular-beam epitaxy and characterized by x-ray diffraction, transmission electron microscopy, and secondary ion mass spectroscopy. Optical properties of these structures were investigated by ambient and high-pressure photoluminescence (PL) measurements. They were strongly affected by polarization-induced electric fields giving rise to a quantum confined Stark effect, depending on the composition of the AlGaN barrier. The optical emission energy redshifts by > 100 meV when the Al content in the barrier increases from x = 0.25 up to x = 1, while the pressure coefficients of the PL energy are significantly reduced in comparison with bulk GaN. The transition energies and their pressure dependencies are modelled for tetragonally strained structures with the same geometry using a full tensorial representation of the strain in the MQWs under external pressure. The same MQWs are also simulated using density functional theory calculations. Additionally, influence of blurring of well-barrier interface on transition energy has been modelled. A good agreement between experimental results and theoretical analysis indicates that nonlinear effects induced by the tetragonal strain due to the lattice mismatch between the substrates and the polar MQWs are responsible for a drastic decrease of the pressure coefficients of PL energy, and that these effects are well described by ab initio calculation procedures. Our results reflect the role of composition and geometry on the basic optical properties of nitride quantum wells.

International audience; The dependence on exciton density of the interwell coupling scheme in a series of InGaN/GaN symmetrical double quantum wells (DQWs) with varying central barrier width was observed. Continuous-wave photolu-minescence (cw-PL) and time-resolved photoluminescence (TRPL), measured at low temperature (6-13 K), allowed us to examine the competition between three optical recombination channels, namely, the recombination of (i) intrawell excitons (DXs), (ii) interwell indirect excitons (IXs), and (iii) presumably coupled well excitons (CWXs), built of electron and hole wave functions that are widely spread over the entire DQW structure. We demonstrate a rather abrupt switching effect that relies on the actual exciton density in the system. In cw-PL experiments as a function of the pumping laser power, this switching is characterized by a threshold laser power density above which we observe (i) a significant change of slope of both the power-dependent blueshift and intensity of the ground-state exciton and (ii) the appearance of higher-energy optical emissions. In TRPL, as the PL intensity decays with time, both these effects are visible but in opposite direction, including the PL intensity transfer from the higher-energy state to the ground state. The observed switching is assigned to a change of the dominant excitonic recombination regime: at low pumping densities the dominant emission arises from the extremely long-lived IX, whereas above threshold the dominant emission corresponds to DXs or CWXs, depending on the barrier width. The threshold power density (or threshold time for TRPL) presents a clearly exponential dependence upon the width of the central barrier, which demonstrates the role of carrier tunneling in the overall switching process. The comparison of IXs in nitride QWs with bias electric-field induced IXs in GaAs/AlGaAs DQWs shows that the spectral blueshifts are a few times larger in the former structures. This enhancement originates from the built-in electric field in group-III nitrides, which has truly microscopic character. Moreover, it is argued that the presence of the potential fluctuations due to alloy disorder and the fluctuations of the coupling barrier width have only a secondary effect on the observed switching.

Spontaneous and piezoelectric polarization in the nitrides is analyzed. The slab model was designed and proved to be appropriate to obtain the spontaneous polarization in AlN, GaN and InN. The spontaneous polarization and polarization related electric fields in AlN, GaN and InN were determined using DFT slab calculations. The procedure generates single value of spontaneous polarization in the nitrides. It was shown that Berry phase polarization may be applied to determination of spontaneous polarization by appropriate addition of polarization induced electric fields. The electric fields obtained from slab model are consistent with the Berry phase results of Bernardini et al. The obtained spontaneous polarization values are: 8.69*10-3 C/m2, 1.88*10-3 C/m2, and 1.96*10-3 C/m2 for AlN, GaN and InN respectively. The related Berry phase polarization values are 8.69*10-2 C/m2, 1.92*10-2 C/m2, and 2.86*10-2 C/m2, for these three compounds, respectively. The GaN/AlN multiquantum wells (MQWs) were simulated using ab intio calculations. The obtained electric fields are in good agreement with those derived from bulk polarization values. GaN/AlN MQWs structures, obtained by MBE growth were characterized by TEM and X-ray measurements. Time dependent photoluminescence measurements were used to determine optical transition energies in these structures. The PL obtained energies are in good agreement with ab initio data confirming overall agreement between theoretical and experimental data.

International audience; In recent years indirect (dipolar) excitons have emerged as highly interesting objects for fundamental studies like Bose-Einstein condensation as well as a concept of excitonic devices for development of excitonic signal processing. An indirect exciton (IX) is a bound pair of an electron and a hole (e-h) in spatially separated quantum wells (QWs). Studies of IX have been concentrated almost entirely on (Al,Ga)As/GaAs coupled double QWs (CDQWs). Due to the large exciton binding energy polar heterostructures of Group III nitrides seem to be more suitable for observation of IX. In the present work we have studied IXs formed by a e-h pair in InGaN/GaN CDQWs. Very thin barrier of 1-2 atomic monolayer (ML) separating QWs enables a tunneling of electrons and holes after optical excitation to the adjacent QWs. The samples consisted of DQWs of In0.17Ga0.83N/In0.02Ga0.98N grown by MBE technique. Intended width of QWs was 2.6 nm and the barrier thickness varied between 1- 8 ML (025-2nm). GaN crystals were used as substrates. The XRD and TEM measurements showed that the obtained structures agree well with the intended ones. Modeling of their band structure using the NEXTNANO software revealed that the structures with the thinnest barriers (1-2 ML) formed one electron (hole) state located in the conduction (valence) band of adjacent QWs. The corresponding emission wavelength was λ≈510 nm. Simulations performed for structures with the thicker barriers demonstrated presence of e- and h-states in each QW and the emission at λ≈450nm. PL measured in these samples showed such an emission. For structures with 1-2 ML barrier we found a peak at λ≈505-520nm which we associated with IX in the system of CDQW. To prove strongly indirect character of the long-wavelength PL-band we performed TRPL characterization of the studied structures. At T=4K, the band at λ≈510nm showed the decay time, τD, approaching msec range. Whereas the band at λ≈450nm is characterized by τD of about 100 ns.

The results of comprehensive theoretical and experimental study of binary GaN/AlN multi-quantum well (MQW) systems oriented along polar c-direction of their wurtzite structure are presented. A series of structures with quantum wells and barriers of various thicknesses were grown by plasma-assisted molecular-beam epitaxy and characterized by x-ray diffraction and transmission electron microscopy. It was shown that in general the structures of good quality were obtained, with the defect density decreasing with increasing quantum well thickness. The optical transition energies in these structures were investigated comparing experimental measurements with ab initio calculations of the entire GaN/AlN MQW structure depending on the QW widths and strains, allowing for direct determination of the energies of optical transitions and the electric fields in wells/barriers by electric potential double averaging procedure. Photoluminescence (PL) measurements revealed that the emission efficiency as well as the shape o...

We have grown GaN films and GaN-AlGaN quantum wells (QWs) on homoepitaxial substrates, by molecular beam epitaxy using ammonia. Both the GaN film and the QW are found to have superior excitonic recombination properties which are extremely promising for the development of indium free ultra-violet lasers based on nitrides. (C) 2001 Published by Elsevier Science Ltd.

GaN epilayers and GaN/AlGaN quantum wells (QWs) were grown by molecular beam epitaxy on GaN(0001) single crystal substrates. Transmission electron microscopy (TEM) was used to assess the crystal quality of the homoepitaxial layers. A dislocation density of less than 10(5) cm(-2) is deduced from TEM imaging. Low temperature (1.8 K) photoluminescence (PL) of homoepitaxial GaN reveals PL linewidths as low as 0.3 meV for bound excitons. The PL integrated intensity variation between 10 and 300 K is compared to that observed on a typical heteroepitaxial GaN/Al2O3 layer. A 2 nm thick GaN/Al0.1Ga0.9N QW has been studied by time-resolved and continuous wave PL. The decay time is close to a purely radiative decay, as expected for a low defect density. Finally, the built-in polarization field measured in a homoepitaxial QW is shown to be comparable to that measured on heteroepitaxial QWs grown either on sapphire or silicon substrates. (C) 2000 American Institute of Physics. [S0021-8979(00)07513- 7].

International audience; In contrast to GaN-based structures grown along [0001], nonpolar growth allows for the realization of thick quantum wells (QWs) with an optimal overlap between electron and hole wavefunctions. However, nonpolar GaN layers grown on non-lattice-matched substrates exhibit high densities of defects. Then, even at low temperature (T), the carrier recombination is mainly nonradiative.Here, we present the dynamics of charge carriers in AlGaN/GaN QWs of various widths and Al-contents grown on the a-facet of GaN crystals. The QW dislocation density and the exciton diffusion length at 300K are 2.105 cm-2 and 100 nm, respectively. Therefore, dislocations play a minor role in the carrier dynamics at 300K. For all samples, we observe an increasing QW PL lifetime with T, indicating the absence of nonradiative phenomena in the low-T range. Purely radiative recombination is observed up to 240K for a 7 nm thick QW. This suggests the possibility of realizing UV emitters with narrow emission and high internal quantum efficiency at 300K.The observed decrease in QW PL lifetime in the high-T range arises from the thermal escape of carriers from the QW to the AlGaN barriers and their subsequent nonradiative recombination. The efficiency of nonradiative recombination at 300K is thus reduced by limiting the thermal escape of carriers from the QW. This is obtained by growing thick QWs rather than increasing the barrier Al-content, which is important from point of view of defect generation.

International audience; In contrast to GaN-based structures grown along [0001], nonpolar growth allows for the realization of thick quantum wells (QWs) with an optimal overlap between electron and hole wavefunctions. However, nonpolar GaN layers grown on non-lattice-matched substrates exhibit high densities of defects. Then, even at low temperature (T), the carrier recombination is mainly nonradiative.Here, we present the dynamics of charge carriers in AlGaN/GaN QWs of various widths and Al-contents grown on the a-facet of GaN crystals. The QW dislocation density and the exciton diffusion length at 300K are 2.105 cm-2 and 100 nm, respectively. Therefore, dislocations play a minor role in the carrier dynamics at 300K. For all samples, we observe an increasing QW PL lifetime with T, indicating the absence of nonradiative phenomena in the low-T range. Purely radiative recombination is observed up to 240K for a 7 nm thick QW. This suggests the possibility of realizing UV emitters with narrow emission and high internal quantum efficiency at 300K.The observed decrease in QW PL lifetime in the high-T range arises from the thermal escape of carriers from the QW to the AlGaN barriers and their subsequent nonradiative recombination. The efficiency of nonradiative recombination at 300K is thus reduced by limiting the thermal escape of carriers from the QW. This is obtained by growing thick QWs rather than increasing the barrier Al-content, which is important from point of view of defect generation.

High-pressure and time-resolved studies of the optical emission from n-type doped GaN/AlN multi-quantum-wells (MQWs) with various well thicknesses are analysed in comparison with ab initio calculations of the electronic (band structure, density of states) and optical (emission energies and their pressure derivatives, oscillator strength) properties. The optical properties of GaN/AlN MQWs are strongly affected by quantum confinement and polarization-induced electric fields. Thus, the photoluminescence (PL) peak energy decreases by over 1 eV with quantum well (QW) thicknesses increasing from 1 to 6 nm. Furthermore, the respective PL decay times increased from about 1 ns up to 10 μs, due to the strong built-in electric field. It was also shown that the band gap pressure coefficients are significantly reduced in MQWs as compared to bulk AlN and GaN crystals. Such coefficients are strongly dependent on the geometric factors such as the thickness of the wells and barriers. The transition energies, their oscilla...

International audience

International audience

We demonstrate a double heterostructure (DH) nitride laser diode (LD) with an untypically wide 9.5 nm InGaN active region instead of the commonly used narrow InGaN quantum wells. Structures were grown on bulk GaN, which ensures low dislocation densities and therefore low concentrations of nonradiative recombination centers. The efficient screening of polarization induced electric fields in the structures under investigation, which contained heavily (1×1019 cm-3) Si doped barriers, was demonstrated by means of hydrostatic pressure dependent photoluminescence measurements on a simplified sample with identical active region. Since the detrimental separation of carriers by electric fields becomes more pronounced for wider InGaN active regions, efficient screening of polarization induced electric fields is essential for the investigated heterostructures. Optical and electrical parameters of this LD were comparable to those of comparable devices with typical QWs of ∼4 nm as active region. We observed a high thermal stability of the photoluminescence intensity and, via time-resolved photoluminescence, a relatively temperature-independent radiative decay time. These observations support the significance of carrier localization phenomena for the radiative recombination processes of the investigated structure. The implications of these results for DH LD structures are discussed.

International audience; The competition between radiative and nonradiative recombination of electron-hole pairs in (Al,In,Ga)N/(Al,In,Ga)N quantum wells of two different compositions and various well widths was investigated in order to understand the microscopic mechanisms of the highly intense light emission from this type of structures. By using time-resolved photoluminescence, we have verified that one can adjust the compositions of the quaternaries so as to optimize the confinement effects and to minimize the built-in electric field which is present in such hexagonal group-III nitride based QWs. The role of local potential fluctuations in the quaternary alloy on the localization of carriers was studied and analyzed by measuring the photoluminescence energy, intensity and dynamics versus temperature.

National audience

International audience; Measurements of (i) the time-resolved photoluminescence and (ii) pressure dependence of the emitted light energy in two series of quaternary (AlInGa)N multiquantum wells have been used to point out the small magnitude of internal electric field as promoting highly efficient luminescence in these specially designed heterostructures. Findings of the experimental examination give the magnitude of built-in electric field few times smaller than that predicted theoretically. Electrical transport measurements support the explanation of the obtained results consisting of the screening of the built-in electric field by means of unintentional doping.

International audience

We investigate the microscopic mechanisms of the highly intense light emission from (Al,Ga,In)N/ (Al,Ga,In)N quantum wells (QW's). We concentrate on the competition between radiative and nonradiative recombination of electron-hole pairs for Al 0 . 1 2 Ga 0 . 8 4 In 0 . 0 4 N/Al 0 . 3 0 Ga 0 . 6 9 In 0 . 0 1 N multiple quantum wells of various widths. These nominal compositions correspond to the maximization of the luminescence intensity. By using time-resolved photoluminescence, we verify that such particular compositions of the quaternaries are capable of minimizing the magnitude of the longitudinal electric field which usually appears in such hexagonal group-III nitride based QW's. We find that the radiative lifetime is nearly independent of the well width, whereas it should show an exponential dependence in the case of a strong electric field. We discuss our results via a theoretical estimation of the internal electric field. We also analyze the role played by local potential fluctuations in the quaternary alloy on the localization of carriers, by measuring the change of the photoluminescence energy, intensity, and dynamics versus the temperature.

International audience; A study of light emission of InAlGaN based multi quantum wells (with different well widths) has been performed by means of hydrostatic pressure and time resolved measurements. Both techniques are very sensitive to the presence of the large internal electric fields in hexagonal InGaN/GaN and GaN/AlGaN heterostructures. In the present studies, we found that independently of the quantum well width the pressure shift of the light emission energy and the photoluminescence decay time show almost constant values. This observation is interpreted as an evidence of the lack of built-in electric field in the used quaternary quantum wells.

International audience; We investigated the relation between structural properties and carrier recombination processes in InGaN∕GaNmultiple quantum well(MQW) structures with quantum well widths of 3 and 9nm, grown by metal-organic chemical-vapor deposition on bulk GaN crystals. Quantum barriers of the samples are heavily n-type doped in order to effectively screen the large polarization-induced electric fields which commonly occur in hexagonal InGaN∕GaN quantum structures. High thermal stability in these structures, reflected by strong photoluminescence(PL) even above 400K, is attributed to a combination of low-dislocation densities and potential profile fluctuations in the InGaN∕GaNquantum wells. The role of potential profile fluctuations is further investigated by time-resolved photoluminescence and cathodoluminescence(CL) mapping. Comparison of both samples shows that the sample with 3‐nm-wide QWs exhibits (i) a larger width of the PL peak in the temperature range of 8–420K, (ii) a higher amplitude of potential profile fluctuations as measured by CL mapping, and (iii) higher radiative and nonradiative PL recombination times. At the same time a much weaker drop of PL intensity with temperature is recorded on the sample with 9‐nm-wide QWs. Our results show that, contrary to intuitive expectation, a decrease of the potential profile fluctuation amplitude can be helpful in enhancing the radiative recombination efficiency, particularly at high temperatures.