1. Evaluation of grain-average stress tensor in a tensile-deformed Al–Mn polycrystal by high-energy X-ray diffraction
- Author
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András Borbély, Loïc Renversade, PMM-ENSMSE- Département Physique et Mécanique des Matériaux, École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT), Centre Science des Matériaux et des Structures (SMS-ENSMSE), Laboratoire Georges Friedel (LGF-ENSMSE), and Université de Lyon-Centre National de la Recherche Scientifique (CNRS)-École des Mines de Saint-Étienne (Mines Saint-Étienne MSE)
- Subjects
Diffraction ,Materials science ,Near and far field ,02 engineering and technology ,3DXRD ,01 natural sciences ,General Biochemistry, Genetics and Molecular Biology ,[SPI.MAT]Engineering Sciences [physics]/Materials ,law.invention ,Optics ,polycrystal plasticity ,DEFORMATION ,law ,diffraction contrast tomography ,0103 physical sciences ,Ultimate tensile strength ,TWIN PAIRS ,PART II ,010302 applied physics ,STRAIN TENSOR ,SINGLE-GRAIN ,Condensed matter physics ,business.industry ,Cauchy stress tensor ,aluminium ,Detector ,INDIVIDUAL BULK GRAINS ,DCT ,Infinitesimal strain theory ,three-dimensional X-ray diffraction ,grain-resolved stress ,MICROSCOPY ,CONTRAST TOMOGRAPHY ,021001 nanoscience & nanotechnology ,Synchrotron ,X-ray diffraction ,X-ray crystallography ,ORIENTATION ,0210 nano-technology ,business ,NEAR-FIELD - Abstract
Three-dimensional X-ray diffraction was applied to characterize the strain/stress evolution in individual grains of an Al–0.3 wt% Mn polycrystal deformedin situat a synchrotron source. Methodological aspects concerning the calibration of the geometrical setup and the evaluation of the strain/stress tensors are discussed. A two-step calibration method separately treating the detector and the rotation axis allows one to determine the centre-of-mass position and crystallographic orientation of grains with standard errors of about 1.5 µm and 0.02°, respectively. Numerical simulations indicate that the error of normal strain components (about 1 × 10−4) is mainly caused by calibration errors, while the error of shear components (about 0.5 × 10−4) is largely influenced by counting statistics and random spot-centre errors due to detector distortion. The importance of monitoring the beam energy is emphasized.
- Published
- 2017