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High group delay dispersion (GDD) is often required for ultrafast laser applications. To achieve GDD level higher than -10000 fs2 in a single mirror setting is difficult due to the high sensitivity to unavoidable production inaccuracies. To overcome the problem, total internal reflection (TIR) based dispersive mirrors have been proposed in theory. In this paper, we report our continuous effort to further design, fabricate and measure TIR based dispersive mirrors.

A special dielectric edge filter extremely sensitive to any change in refractive indices, layer thicknesses and angle of incidence has been investigated using holographic pump-probe measurements at different intensity values. Different physical processes overlapping in time were found to occur, namely the Kerr effect, free- electron generation and their subsequent trapping. A numerical model was used to reproduce the experimental results and decouple these processes.

We report a challenging design, fabrication and post-production characterization problem of a dispersive mirror supporting the spectral range from 2000 nm to 2200 nm and providing a group delay dispersion of -1000 fssup2/sup. The absolute reflectance in the working range is over 99.95%. The reported mirror is a critical element for Tm and Ho based lasers and paves the way for the development of ultrafast 2 µm lasers with sub-100 fs pulse duration.

A specially designed and produced edge filter with pronounced nonlinear effects is carefully characterized. The nonlinear effects are estimated at the intensities close to the laser-induced damage., Comment: 3 pages

We developed a new method aimed at designing short-pass filters, long-pass filters and filters blocking sidebands of Fabry-Perot bandpasses. The method is an automated version of a non-straightforward empirical approach invented as a result of many years’ experience in design and production of optical coatings. The method allows obtaining near-quarter-wave solutions in a few seconds. In many cases these solutions are more advantageous for deposition systems.

Each complicated coating, in particular, a dispersive mirror consists of dozens of layers. Thin films layers have mechanical stresses. After summing up stresses from all layers, the resulting stress is high enough to bend even a relatively thick substrate. To avoid this effect we suggest depositing an antireflection coating (AR) at the back-side of the substrate which together with suppression of unwanted reflections from the back side will also compensate this stress. We demonstrate unique, extremely thick and sophisticated AR coating consisting of 71 layers with the total physical thickness of 7.5 µm. This AR coating completely compensates stress from the dispersive mirror coated on the front side and minimizes unwanted reflections.

Dielectric multilayer coatings exhibiting steep reflectance in an extremely narrow transition zone, highly sensitive to any variations of layer refractive indices and therefore suitable for studying the nonlinear properties are produced and characterized. Increase of reflectance at growing intensity reveals the presence of the optical Kerr effect. A new method calculating intensity dependent spectral characteristics of multilayer optical coatings in the case of nonlinear interaction with high intensity laser pulses is developed. The method is based on the numerical solution of a boundary-value problem derived from the system of Maxwell equations describing the propagation of light through a multilayer system. The method opens a way to synthesis of optical coatings with predictable nonlinear properties. Comparison of our numerical modelling with experimental data enabled us to accurately determine the Kerr coefficients n2 of the widely-used thin-film materials Ta2O5 and Nb2O5.

We report on design, production and characterization of an extremely broadband multilayer beamsplitter, covering wavelength range from 0.67 - 2.6 µm. The group delay dispersion has small oscillations in the above mentioned working range. We used a new algorithm with floating constants allowing us to obtain a smooth and near constant GDD. The optical element based on the beamsplitter is used for dividing a low-energy super-octave spectrum into several sub-spectral regions which are later amplified and coherently combined.

We explain reasons of oscillations frequently observed in total losses spectra (1 − R − T) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film. The third reason is a slight thickness non-uniformity of the film. We observe a good agreement between theoretical models and corresponding measurements, which proves above statements on the origins of oscillations in total losses.

Optical properties of metal island films (MIFs) can be combined with interference of dielectric coatings. A set of multilayer designs containing metal clusters reflecting different colours from front and back side of the coating was obtained by numerical optimization. The chosen designs presenting the range of feasible colours were deposited by electron beam evaporation. Spectrophotometric and ellipsometric measurements verified that the produced coatings present an excellent agreement with the optical performance calculated from the designs. Numerical optimization was verified as a useful method in designing of coatings containing MIFs. This approach can ease the implementation of metal clusters into multilayer designs and broaden the applications of MIFs.

Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.

A new empirical expression for estimating minimum achievable residual reflectance of antireflection (AR) coatings is presented. The expression gives an accurate approximation of the minimum residual reflectance for normal- and oblique-incidence AR coatings in the visible and infrared spectral ranges.

We present a theoretical approach enabling one to perform a preproduction investigation of the effect of accumulation of thickness errors in the course of optical coating production using broadband optical monitoring. On the basis of this approach we investigate and compare thickness errors that may be associated with such factors as random and systematic errors in measurement data, instabilities of deposition rates, and inaccuracies of on-line algorithms predicting termination instants for layer depositions.

New optical coating design algorithm with the equivalent layers theory is presented. The algorithm is based on the merit-function-constrained optimization in the accessible domain of equivalent phase thicknesses and equivalent refractive indices. It allows for creation of design coatings with sophisticated narrowband spectral characteristics. (

We present a new design for an omnidirectional antireflection coating for the visible spectral range. In contrast to classical designs, it combines homogeneous layers and linear gradient index layers into one hybrid design with a full thickness of approximately 500 nm. The coating may be practically produced based on silicon dioxide as low index material and niobium pentoxide as high index material, while intermediate indices may be obtained from corresponding mixtures.

The determination of optical parameters of thin films from experimental data is a typical task in the field of optical-coating technology. The optical characterization of a single layer deposited on a substrate with known optical parameters is widely used for this purpose. Results of optical characterization are dependent on not only the choice of the thin-film model but also on the quality of experimental data. The theoretical results presented highlight the effect of systematic errors in measurement data on the determination of thin-film parameters. Application of these theoretical results is illustrated by the analysis of experimental data for magnesium fluoride thin films.

We studied e-beam evaporated TiO2 films deposited at two different substrate temperatures between 120°C and 300°C. We reliably characterized the film samples on the basis of in situ and ex situ measurements. We carried out annealing on the samples and studied the induced changes in the properties of the films. The results can be useful for further laser-induced damage threshold investigations.

We demonstrate selection of reliable approaches for post-production characterization of oblique incidence multilayer optical coatings. The approaches include choice of input information, selection of adequate coating model, corresponding numerical characterization algorithm, and verification of the results. Applications of the approaches are illustrated with post-production characterization of oblique incidence edge filter, oblique incidence beam splitter and oblique incidence 43-layer quarter-wave mirror.

Applications of computational manufacturing experiments (CMEs) for selection of the most manufacturable designs among a variety of different design solutions are demonstrated. We compare design solutions with respect to estimations of their production yields. Computational experiments are performed using two simulation software tools. In the course of CMEs, we take into account all major factors causing errors in our deposition process. Real deposition experiments are in agreement with CMEs; the most manufacturable design exhibits better target performances compared to other designs.

We propose a general approach that allows one to reveal factors causing production errors in the course of the deposition process controlled by broadband optical monitoring. We consider computational experiments simulating the real deposition process as a crucial point of this approach. We demonstrate application of the approach using multiple experimental deposition runs of the selected multilayer coatings.

Determination of actual parameters of manufactured optical coatings (reverse engineering of optical coatings) provides feedback to the design-production chain and thus plays an important role in raising the quality of optical coatings production. In this paper, the reliability of reverse engineering results obtained using different types of experimental data is investigated. Considered experimental data include offline normal incidence transmittance data, offline ellipsometric data, and online transmittance monitoring data recorded during depositions of all coating layers. Experimental data are obtained for special test quarter-wave mirrors with intentional errors in some layers. These mirrors were produced by a well-calibrated magnetron-sputtering process. The intentional errors are several times higher than estimated errors of layer thickness monitoring, and the reliability of their detection is used as a measure of reliability of reverse engineering results. It is demonstrated that the most reliable results are provided by online transmittance data.

In the present study we determine the optical parameters of thin metal–dielectric films using two different characterization techniques based on nonparametric and multiple oscillator models. We consider four series of thin metal–dielectric films produced under various deposition conditions with different optical properties. We compare characterization results obtained by nonparametric and multiple oscillator techniques and demonstrate that the results are consistent. The consistency of the results proves their reliability.

We deal with optimal two-material antireflection (AR) coatings for the visible and adjacent spectral regions. It has been shown before that, for a given set of input parameters (refractive indices of the substrate, ambient medium and high- and low-index coating materials, and for a given spectral width of the AR coating), such designs consist of one or more clusters of layers of approximately constant optical thickness and number of layers. We show that, through the analysis of many different optimal coatings, it is possible to derive two parameters for a simple empirical expression that relates the residual average reflectance in the AR region to the number of clusters. These parameters are given for all possible combinations of relative spectral bandwidth equal to 2, 3, and 4; low-index to ambient-medium index ratio equal to 1.38 and 1.45; and high-to-low index ratio equal to 1.4, 1.5, and 1.7. The agreement between the numerically and the empirically calculated values of residual average reflectance is excellent. From the information presented the optical thin-film designer can quickly calculate the required number of layers and the overall optical thickness of an AR coating having the desired achievable residual average reflectance.

To enable the enhancement of few-cycle pulses in high-finesse passive optical resonators, a novel complementary-phase approach is considered for the resonator mirrors. The design challenges and first experimental results are presented., 3 pages