1. Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping
- Author
-
David Stifter, Michael Pircher, Christoph K. Hitzenberger, Gabi Grützner, Gisela Ahrens, Karin Wiesauer, Reinhold Oster, and Rainer Engelke
- Subjects
Materials science ,Birefringence ,genetic structures ,medicine.diagnostic_test ,business.industry ,Strain mapping ,Coherence length ,Interferometry ,Polarization sensitive ,Optics ,Ultrahigh resolution ,Optical coherence tomography ,Transversal (combinatorics) ,medicine ,sense organs ,business - Abstract
Optical coherence tomography (OCT), originally developed and so far nearly exclusively used for biomedical applications (e.g., [1,2]), is a contact-free, non-destructive technique based on low-coherence interferometry to image structures within translucent and turbid materials. Commonly, cross-sectional reflectivity images with a depth-resolution determined by the coherence length of the near-infrared light source are obtained. When OCT is performed in a polarization sensitive way (PS-OCT), additional information about birefringence within a material is obtained by mapping the retardation between ordinary and extraordinary rays [3]. Because birefringence is induced when strain occurs, PS-OCT provides depth resolved information about the internal stress within a sample.
- Published
- 2008
- Full Text
- View/download PDF