1. Investigation of magnetic properties for Hf4+ substituted CeO2 nanoparticles for spintronic applications.
- Author
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Alla, S. K., Mandal, R. K., Prasad, N. K., Kollu, P., Meena, Sher Singh, Poswal, H. K., and Prajapat, C. L.
- Subjects
NANOPARTICLES ,SPINTRONICS ,X-ray diffraction ,TRANSMISSION electron microscopy ,PHOTOLUMINESCENCE - Abstract
The single phase Hf
x Ce1−x O2 (x = 0.01, 0.05 and 0.1) nanoparticles were produced via microwave refluxing technique. The substitution of Hf-ions into CeO2 lattice has been demonstrated by X-ray diffraction and transmission electron microscopy analyses. X-ray photoelectron spectroscopy analysis indicated that Ce was present in + 3 and + 4 states whereas Hf in + 4 state. Raman, UV-Vis and photoluminescence spectroscopic analyses revealed the formation of surface defects including oxygen vacancies in the samples. The estimated defect concentration was 1.09 × 1021 , 1.32 × 1021 and 1.49 × 1021 cm−3 for x = 0.01, 0.05 and 0.1 samples respectively. The room temperature ferromagnetic behavior for the samples originate from the surface oxygen vacancies. The prevalence of ferromagnetic clusters considerably raised the MS value for x = 0.05 sample. The augmentation in the MS values with increased Hf concentration could be attributed to the increase in the defect concentration. [ABSTRACT FROM AUTHOR]- Published
- 2018
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