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Investigation of magnetic properties for Hf4+ substituted CeO2 nanoparticles for spintronic applications.
- Source :
- Journal of Materials Science: Materials in Electronics; Jun2018, Vol. 29 Issue 12, p10614-10623, 10p
- Publication Year :
- 2018
-
Abstract
- The single phase Hf<subscript>x</subscript>Ce<subscript>1−x</subscript>O<subscript>2</subscript> (x = 0.01, 0.05 and 0.1) nanoparticles were produced via microwave refluxing technique. The substitution of Hf-ions into CeO<subscript>2</subscript> lattice has been demonstrated by X-ray diffraction and transmission electron microscopy analyses. X-ray photoelectron spectroscopy analysis indicated that Ce was present in + 3 and + 4 states whereas Hf in + 4 state. Raman, UV-Vis and photoluminescence spectroscopic analyses revealed the formation of surface defects including oxygen vacancies in the samples. The estimated defect concentration was 1.09 × 10<superscript>21</superscript>, 1.32 × 10<superscript>21</superscript> and 1.49 × 10<superscript>21</superscript> cm<superscript>−3</superscript> for x = 0.01, 0.05 and 0.1 samples respectively. The room temperature ferromagnetic behavior for the samples originate from the surface oxygen vacancies. The prevalence of ferromagnetic clusters considerably raised the M<subscript>S</subscript> value for x = 0.05 sample. The augmentation in the M<subscript>S</subscript> values with increased Hf concentration could be attributed to the increase in the defect concentration. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09574522
- Volume :
- 29
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Journal of Materials Science: Materials in Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 129738871
- Full Text :
- https://doi.org/10.1007/s10854-018-9125-x