1. Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam
- Author
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Toshinori Yabuuchi, Massimo Piccinini, S. S. Makarov, Daisuke Sagae, Takeshi Matsuoka, R. M. Montereali, S. A. Pikuz, Makina Yabashi, Tatiana Pikuz, Enrico Nichelatti, M. Koenig, Maria Aurora Vincenti, Norimasa Ozaki, Francesca Bonfigli, Yuichi Inubushi, Nickolas Hartley, Juha, Libor, Bonfigli, F., Hartley, N. J., Inubushi, Y., Koenig, M., Matsuoka, T., Makarov, S., Montereali, R. M., Nichelatti, E., Ozaki, N., Piccinini, M., Pikuz, S., Pikuz, T., Sagae, D., Vincenti, M. A., Yabashi, M., and Yabuuchi, T.
- Subjects
Materials science ,Photoluminescence ,Physics::Optics ,Photoluminescent color centers ,law.invention ,SACLA ,chemistry.chemical_compound ,Photoluminescent color center ,Optics ,Optical microscope ,law ,Physics::Atomic and Molecular Clusters ,Irradiation ,Hard X-ray FEL ,LiF imaging detectors ,Pump-probe experiment ,X-ray radiography ,business.industry ,Free-electron laser ,Lithium fluoride ,Pulse duration ,LiF imaging detector ,chemistry ,Physics::Accelerator Physics ,business ,Beam (structure) - Abstract
We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.
- Published
- 2019