Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam

Authors :: Toshinori Yabuuchi
Massimo Piccinini
S. S. Makarov
Daisuke Sagae
Takeshi Matsuoka
R. M. Montereali
S. A. Pikuz
Makina Yabashi
Tatiana Pikuz
Enrico Nichelatti
M. Koenig
Maria Aurora Vincenti
Norimasa Ozaki
Francesca Bonfigli
Yuichi Inubushi
Nickolas Hartley
Juha, Libor
Bonfigli, F.
Hartley, N. J.
Inubushi, Y.
Koenig, M.
Matsuoka, T.
Makarov, S.
Montereali, R. M.
Nichelatti, E.
Ozaki, N.
Piccinini, M.
Pikuz, S.
Pikuz, T.
Sagae, D.
Vincenti, M. A.
Yabashi, M.
Yabuuchi, T.
Publication Year :: 2019
Publisher :: SPIE, 2019.
Abstract: We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.

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