8 results on '"Sanders, Toby"'
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2. Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices.
3. Inpainting Versus Denoising for Dose Reduction in STEM.
4. Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices.
5. Inpainting Versus Denoising for Dose Reduction in STEM.
6. Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices.
7. Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices.
8. Advanced 3-D Reconstruction Algorithms for Electron Tomography.
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