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He developed the first practical Monte Carlo electron trajectory simulations to aid SEM image interpretation in support of semiconductor device metrology. It is with a heavy heart that I undertake to write this remembrance of an extraordinary member of the microscopy and microanalysis community, Professor David C. Joy (Figure 1), who passed away on August 10, 2022, at the age of 79. He somehow found time in his extraordinarily busy schedule to help me in my Doctor of Philosophy research to apply the SEM to study the deformation of materials I in situ i , including applying electron channeling patterns/contrast, another SEM topic to which David had already made fundamental contributions. [Extracted from the article]

“Second best no more” was the title of an article written by David C. Joy for Nature Materials. The article was for highlighting a breakthrough made by a team formed between Brookhaven National Laboratory (BNL, USA) and Hitachi High Technologies Corporation (HHT, Japan). Sub-angstrom secondary electron (SE) images were obtained on a Hitachi HD-2700, which is a combined scanning electron microscope (SEM) and scanning transmission electron microscope (STEM) operating at a maximum accelerating voltage of 200 kV. For the first time, single atoms and atomic lattices on crystal surfaces are unambiguously presented in SE images. [ABSTRACT FROM PUBLISHER]

Many industrial companies do not have the expertise, experience, or in-house analytical instrumentation to conduct routine laboratory testing. As such, selecting a contract analytical services provider is a common task. Outsourcing is a cost-effective alternative that can allow companies to increase analytical information available for timely decisions regarding product development and production (see Figure 1). [ABSTRACT FROM PUBLISHER]

Over the past fifty years the scanning electron microscope (SEM) has established itself as the most versatile and productive tool for imaging and microanalysis in many areas of science and technology, and some seventy-thousand instruments generate millions of micrographs every day. Scanning electron microscopes do, however, have one fundamental limitation in that the only experimental variable available to the operator is the choice of the accelerating voltage. Although the ability to vary beam energy is both necessary and important, it is an unfortunate fact that changing the beam energy also alters many aspects of performance: imaging resolution, relative strength of different signal components, depth of beam penetration, capabilities of the various analytical systems, and the severity of charging and beam-induced damage. This makes it difficult or impossible to optimize the interaction of interest. [ABSTRACT FROM PUBLISHER]

Because the ability to perform some form of chemical microanalysis has become an essential feature for any microscope, it is necessary to investigate what options are available in the new “ORION” helium ion microscope (HIM). The HIM has the ability to visualize local variations in specimen chemistry in both the ion induced secondary electron and the Rutherford backscattered imaging modes, but this provides only limited and qualitative information. Quantitative, elementally specific, microanalysis could be performed in the HIM using secondary electron spectroscopy, Rutherford backscattered ion spectroscopy, or secondary ion mass spectroscopy, but while each of these options has promise, none of them can presently guarantee either reliable element identification or quantitative analysis across the periodic table. [ABSTRACT FROM AUTHOR]

The article offers information on the journal "Microscopy and Microanalysis (MAM)," Volume 17. It presents a calendar of meetings and events in Nashville, Tennessee on August 5-11, 2011, as well as the floor map of Nashville Convention Center. It mentions various committee and business meetings at Nashville Convention Center along, with the registration cancellation and refund policy. Moreover, information on the members of the Program Committee is presented.

Fellow Microscopists and Microanalysts, Colleagues and most importantly Students, welcome to Microscopy & Microanalysis 2011 here in Nashville, Tennessee, our seventeenth conference under that appellation. [ABSTRACT FROM PUBLISHER]

Selected postings from the Microscopy Listserver from February 1, 2010 to April 1, 2010. Complete listings and subscription information can be obtained at http://http://www.microscopy.com. Postings may have been edited to conserve space or for clarity. [ABSTRACT FROM PUBLISHER]

Information about several symposium to be held in the U.S. in July 2009 which includes the "A-03 Quantitative Atom-Probe Tomography," "A-05 Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences," and the "A-06 Advances in Fluorescent Nanoprobes for Cellular and In-Vivo Imaging."

The article announces awards given by the Microbian Analysis Society (MAS) to scientists including the Duncumb Award for Excellence in Microanalysis to David Joy of the University of Tennessee in Knoxville, the K. F. J. Heinrich Award to Hendrix Demers of the Electrical Engineering Department at the Université de Sherbrooke in Quebec, and the MAS Service Award to Scott Wight of the Surface and Microanalysis Science Division at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER]

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 [ABSTRACT FROM PUBLISHER]

The article lists several books including "Handbook of Geriatric Nutrition," edited by Jeng Hsu and Robert Davis, "Five Kingdoms: An Illustrated Guide to the Phyla of Life on Earth," by Lynn Margulis and Karlene V. Schwartz and "Calculator Programming for Chemistry and the Life Sciences," by Frank H. Clarke.