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This study is aimed to build up a structure of circular city planning index with Essential Analysis Model (EAM). As countries around the world are engaged in finding solutions against increasingly exhausting resources and energies, the circular city is trending the metro development in future. This mandates a structure for index in circular city planning in future. To ensure the practice of the structure, it is to be based on circular economy and derived by “target oriented” essence logic. This study employs semi-structured exert interview to get professional inputs from more comprehensive population. A hierarchical structure of 18 major and 53 minor indexes is set up with the help of mind map software which may be referenced by government agencies, metro governance, urban and rural planning, and relevant competent authority in their circular city planning endeavor.

The authors have made an extensive investigation of the phase diagrams and the associated micro-structure of a pseudo-ternary system AOT/water (0.6 wt.% NaCl)/decane. This micro-emulsion system shows, for a surfactant concentration in excess of 6 wt.%, a characteristic phase progression from a water-in-oil (W/O) micro-emulsion in coexistence with excess water at low temperatures to an oil-in-water (O/W) micro-emulsion in coexistence with excess oil at high temperatures through a one-phase micro-emulsion in the intermediate temperatures. Thus, one expects a structural inversion to occur somewhere in the one-phase channel. They have performed extensive small angle neutron scattering (SANS) measurements to study the pathway of such a structural inversion in this micro-emulsion system when there are comparable amounts of oil and water in the system, and when the volume fraction of water is much higher than that of oil. In the former case, the authors observed the inversion of the W/O to the O/W micro-emulsions through an intermediate bicontinuous one-phase micro-emulsion. In the latter case, they show that the inversion takes place through a pathway of L3-Lalpha -L1 as temperature increases. Particular emphasis is put on analyses of the interfacial structure in different micro-emulsion phases.

To provide coherent x-ray sources for probing the dynamic structures of solid or liquid biological substances on the picosecond timescale, a high-aspect-ratio x-ray resonator cavity etched from a single crystal substrate with a nearly vertical sidewall structure is required. Although high-aspect-ratio resonator cavities have been produced in silicon, they suffer from unwanted multiple beam effects. However, this problem can be avoided by using the reduced symmetry of single-crystal sapphire in which x-ray cavities may produce a highly monochromatic transmitted x-ray beam. In this study, we performed nominal 100 µm deep etching and vertical sidewall profiles in single crystal sapphire using inductively coupled plasma (ICP) etching. The large depth is required to intercept a useful fraction of a stopped-down x-ray beam, as well as for beam clearance. An electroplated Ni hard mask was patterned using KMPR 1050 photoresist and contact lithography. The quality and performance of the x-ray cavity depended upon the uniformity of the cavity gap and therefore verticality of the fabricated vertical sidewall. To our knowledge, this is the first report of such deep, vertical etching of single-crystal sapphire. A gas mixture of Cl2/BCl3/Ar was used to etch the sapphire with process variables including BCl3 flow ratio and bias power. By etching for 540 min under optimal conditions, we obtained an x-ray resonant cavity with a depth of 95 µm, width of ~30 µm, gap of ~115 µm and sidewall profile internal angle of 89.5°. The results show that the etching parameters affected the quality of the vertical sidewall, which is essential for good x-ray resonant cavities.

Short-range-order and long-range-order structures in Ge1 − xSn x /Ge thin films grown by molecular beam epitaxy (MBE) were investigated by using extended x-ray absorption fine structure (EXAFS) and x-ray diffraction (XRD) techniques, respectively. These materials are of great potential for constructing efficient optoelectronic devices. The EXAFS analysis demonstrates that Sn atoms occupy Ge sites in these thin-film samples with Sn concentration up to 20 at.%. The Ge-Sn bonds expected in the substitutional model were also observed in Raman spectra of these samples. The XRD results show that, in the out-of-plane direction, the lattice constants of the films are distinctly larger than that of the Ge substrates. However, such increased lattice parameters were not observed in the in-plane direction. Our x-ray and Raman results have clearly revealed substitutional incorporation of Sn with high concentration in dislocation-free MBE-grown Ge films of practical-device thickness.

The TPS-05A beamline is the first X-ray beamline at NSRRC built for micro protein crystallography experiment as well as one of the seven ID beamlines in phase I at the TPS synchrotron facility. A 2-meter in-vacuum undulator (IU22) serves as the photon source from which the harmonics #3 to #9 will provide brilliance of 1018−1020 photons s−1 mrad−2 mm−2 (0.1% bandwidth)−1 and photon flux of 1013−1014 photons s−1 (0.1% bandwidth)−1 in the required energy range of 5.7−20 keV (2.175−0.620 A) to cover MAD phasing experiments at 1 A and SAD phasing experiments at 2 A. The beamline optics consists of a cryo-cooled double crystal monochromator (DCM) and a pair of focusing K-B mirrors. Requirements from the user group include a target focus size of 50 μm × 50 μm (H × V) at the sample position, photon flux greater than 2 × 1012 photons s−1 at Se K-edge (0.9795 A), pinholes for adjusting the beam size down to 5 μm. Calculation of heat load for the first optical element, i.e. the first crystal of DCM, is included in this paper.