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6. Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J. Phys: D. Appl. Phys.52 034004).

Author

Platier, B, Wetering, F M J H van de, Ninhuijs, M A W van, Brussaard, G J H, Banine, V Y, Luiten, O J, and Beckers, J

Subjects
CAVITY resonators, TRANSIENTS (Dynamics), PHOTON counting, IONIZING radiation, ELECTRONS, MICROWAVE plasmas, FREE electron lasers, LASER plasmas
Abstract

A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers J et al 2018 J. Phys. D: Appl. Phys. 52 034004). Due to the recent detection and investigation of an additional third decay regime of the afterglow of an extreme ultraviolet photon-induced plasma described in a later article (Platier B et al 2020 Appl. Phys. Lett. 116 103703) there is an additional reason for a minimum number of photons for this approach to work. Near or below this threshold, we explain that the response time of the diagnostic method is a limiting factor. Further, a second limit for the number of photons within a pulse is formalized related to the trapping of highly energetic free electrons. [ABSTRACT FROM AUTHOR]

Published
2020
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