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Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J. Phys: D. Appl. Phys.52 034004).
- Source :
- Journal of Physics D: Applied Physics; 8/26/2020, Vol. 53 Issue 35, p1-3, 3p
- Publication Year :
- 2020
-
Abstract
- A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers J et al 2018 J. Phys. D: Appl. Phys. 52 034004). Due to the recent detection and investigation of an additional third decay regime of the afterglow of an extreme ultraviolet photon-induced plasma described in a later article (Platier B et al 2020 Appl. Phys. Lett. 116 103703) there is an additional reason for a minimum number of photons for this approach to work. Near or below this threshold, we explain that the response time of the diagnostic method is a limiting factor. Further, a second limit for the number of photons within a pulse is formalized related to the trapping of highly energetic free electrons. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00223727
- Volume :
- 53
- Issue :
- 35
- Database :
- Complementary Index
- Journal :
- Journal of Physics D: Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 144665511
- Full Text :
- https://doi.org/10.1088/1361-6463/ab8f53