Back to Search Start Over

Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J. Phys: D. Appl. Phys.52 034004).

Authors :
Platier, B
Wetering, F M J H van de
Ninhuijs, M A W van
Brussaard, G J H
Banine, V Y
Luiten, O J
Beckers, J
Source :
Journal of Physics D: Applied Physics; 8/26/2020, Vol. 53 Issue 35, p1-3, 3p
Publication Year :
2020

Abstract

A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers J et al 2018 J. Phys. D: Appl. Phys. 52 034004). Due to the recent detection and investigation of an additional third decay regime of the afterglow of an extreme ultraviolet photon-induced plasma described in a later article (Platier B et al 2020 Appl. Phys. Lett. 116 103703) there is an additional reason for a minimum number of photons for this approach to work. Near or below this threshold, we explain that the response time of the diagnostic method is a limiting factor. Further, a second limit for the number of photons within a pulse is formalized related to the trapping of highly energetic free electrons. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00223727
Volume :
53
Issue :
35
Database :
Complementary Index
Journal :
Journal of Physics D: Applied Physics
Publication Type :
Academic Journal
Accession number :
144665511
Full Text :
https://doi.org/10.1088/1361-6463/ab8f53