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Your search keyword '"S A, Jerger"' showing total 2 results
Start Over Author "S A, Jerger" Publisher institute of electrical and electronics engineers (ieee)
2 results on '"S A, Jerger"'

1. Temperature dependence of radiation damage and its annealing in silicon detectors

Author

Hartmut Sadrozinski, W.A. Rowe, D. Joyce, A. P.T. Palounek, Hans Ziock, J.S. Kapustinsky, J. A. J. Matthews, J. Leslie, J.G. Boissevain, S. A. Jerger, A. Seiden, D. Skinner, D. Pitzl, J.K. Fleming, C. Lietzke, Max Wilder, E. Spencer, J. Ellison, K. Holzscheiter, E. Reed, Emanuela Barberis, W.E. Sondheim, Phillip D. Ferguson, M. Frautschi, Stephen Wimpenny, and Nicolo Cartiglia

Subjects
Physics, Nuclear and High Energy Physics, Silicon, Physics::Instrumentation and Detectors, Annealing (metallurgy), business.industry, chemistry.chemical_element, Biasing, Particle detector, Semiconductor detector, Nuclear Energy and Engineering, Operating temperature, chemistry, Radiation damage, Optoelectronics, High Energy Physics::Experiment, Irradiation, Electrical and Electronic Engineering, business
Abstract

Silicon detectors at future collider facilities such as the Superconducting Super Collider (SSC) will be exposed to large fluences of both neutral and charged particles, resulting in considerable bulk radiation damage. In order to reduce the increase in leakage current associated with that damage, the proposed operating temperature of the silicon detectors in the SSC Solenoidal Detector Collaboration (SDC) experiment is 0 degrees C. In order to explore any potential complications of operating detectors at 0 degrees C, two sets of detectors were irradiated. One set was kept close to 0 degrees C during the exposure and annealing period, while the other was maintained at room temperature throughout ( approximately 27 degrees C during the exposure, and approximately 23 degrees C during the annealing period). The full depletion voltage and leakage current of the detectors during the irradiation period and over the subsequent annealing period were monitored. It is concluded that detectors will have to be operated at 0 degrees C, and, once damaged, be maintained at 0 degrees C in order to keep their operating voltage at a reasonable value ( >

Published
1993

2. The VME-based D0 muon trigger electronics

Author

H. T. Diehl, R. Li, B. Baldin, C. Rotolo, C. Lietzke, S. Repond, Shuichi Kunori, K. A. Johns, P. Martin, S. Igarashi, H. Jostlein, R. Zazula, D. Hedin, Y. Zhou, J. N. Butler, J. Li, V. Glebov, R. Yamada, T. Marshall, D. Eartly, H. Haggerty, Sergey Denisov, H. Mao, S. A. Jerger, A. Taketani, T. Fahland, P. Xie, T. Fitzpatrick, K. Bazizi, V. M. Podstavkov, James C. Green, M. Fortner, R. Meng, N.V. Mokhov, S. Hansen, R. E. Hall, J. Hawkins, R. Morphis, David Smith, D. Denisov, Dan Green, Yu.M. Antipov, and S. Willis

Subjects
Physics, Nuclear and High Energy Physics, Muon, Physics::Instrumentation and Detectors, business.industry, Detector, Electrical engineering, Particle detector, Nuclear Energy and Engineering, Parallel processing (DSP implementation), Backplane, Nuclear electronics, High Energy Physics::Experiment, Fermilab, Electrical and Electronic Engineering, business, VMEbus
Abstract

The trigger electronics for the muon system of the Fermilab D0 detector is described. The hardware trigger consists of VME-based cards designed to find probable tracks in individual chambers and then match these track segments. The fast trigger is highly parallel and able to discern probable tracks from about 15000 trigger cells in under 200 ns from receipt of all bits in the counting house. There is a parallel confirmation trigger with a response time of 1-5 mu s that provides a crude calculation of the momentum and charge of the muon. >

Published
1991

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