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Your search keyword '"Toshimasa Kuchii"' showing total 1 results
Start Over Author "Toshimasa Kuchii" Publisher ieee comput. soc
1 results on '"Toshimasa Kuchii"'

1. Supply current test for unit-to-unit variations of electrical characteristics in gates

Author

Takeomi Tamesada, Masaki Hashizume, and Toshimasa Kuchii

Subjects
Digital electronics, Engineering, Pass transistor logic, business.industry, Logic gate, Logic family, Electronic engineering, Inverter, Logic level, Test method, business, Pull-up resistor
Abstract

A practical supply current test method is proposed and the experimental evaluation results are presented. In the method, the unit-to-unit variation of electrical characteristics in each logic gate is modeled as a Gaussian distribution and faults are detected with a statistical hypothesis technique.

Published
2002
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