Supply current test for unit-to-unit variations of electrical characteristics in gates

Authors :: Takeomi Tamesada
Masaki Hashizume
Toshimasa Kuchii
Source :: Asian Test Symposium
Publication Year :: 2002
Publisher :: IEEE Comput. Soc, 2002.
Abstract: A practical supply current test method is proposed and the experimental evaluation results are presented. In the method, the unit-to-unit variation of electrical characteristics in each logic gate is modeled as a Gaussian distribution and faults are detected with a statistical hypothesis technique.

Subjects :: Digital electronics
Engineering
Pass transistor logic
business.industry
Logic gate
Logic family
Electronic engineering
Inverter
Logic level
Test method
business
Pull-up resistor

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