1. An on-chip monitoring structure for electromigration failure
- Author
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Yi-Qi Zhuang, Xiao-Ming Li, Hao Bai, and Yu-bing Lv
- Subjects
Structure (mathematical logic) ,Downtime ,ALARM ,Engineering ,business.industry ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,Hardware_PERFORMANCEANDRELIABILITY ,business ,Device failure ,Electromigration ,Reliability engineering - Abstract
This paper discloses an electromigration (EM) monitoring circuit structure for an on-chip end-of-life indicator, which can be integrated and degraded with the device, and give an alarm when the device needs replacing. This is done prior to actual device failure and estimate down time of the system where this IC is used, and it only needs a very small area
- Published
- 2006
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