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An on-chip monitoring structure for electromigration failure.
- Source :
- 2006 8th International Conference on Solid-State & Integrated Circuit Technology Proceedings; 2006, p1186-1188, 3p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9781424401604
- Database :
- Complementary Index
- Journal :
- 2006 8th International Conference on Solid-State & Integrated Circuit Technology Proceedings
- Publication Type :
- Conference
- Accession number :
- 80811802
- Full Text :
- https://doi.org/10.1109/ICSICT.2006.306071