48 results on '"Segal, J."'
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2. Characterization of ePixUHR-35kHz: a 13.8 Gb/s full-frame X-ray imaging readout ASIC for the LCLS-II upgrade
3. SparkPix-T: Spatial and Time Resolving Front-End ASIC with MHz-Rate Information Extraction for Momentum Spectroscopy at LCLS-II
4. ePixM: a CMOS monolithic sensor for LCLS II
5. High Resolution, Seamless ePix10K Cameras for Wavelength-Dispersive Spectroscopy
6. The CHESS-2 prototype in AMS 0.35 μm process: A high voltage CMOS monolithic sensor for ATLAS upgrade
7. Design and characterization of the tPix prototype: A spatial and time resolving front-end ASIC for electron and ion spectroscopy experiments at LCLS
8. Wrapped-around conductive traces
9. Flip chip assembly for cryogenics and flexible substrates
10. Radiovoltaics: High-efficiency conversion of ionizing radiation directly to electrical power
11. Studies of the ePix100 low-noise x-ray camera at SLAC
12. Characterization of the ePix10k camera at SSRL and LCLS
13. Design and characterization of the ePix10k prototype: A high dynamic range integrating pixel ASIC for LCLS detectors
14. 2nd generation cameras for LCLS and the new challenges of high repetition rates at LCLS-II
15. Detectors in extreme conditions
16. Design and characterization of the ePix100a: A low noise integrating pixel ASIC for LCLS detectors
17. Designing Primers with Higher Taxonomic Distinguishability
18. A Metagenomic Approach to the Airways Microbiome of Chronic Obstructive Pulmonary Disease (COPD)
19. Detector Damage at X-Ray Free-Electron Laser Sources.
20. eLine100: A front end ASIC for LCLS detectors in low noise applications
21. Second generation monolithic full-depletion radiation sensor with integrated CMOS circuitry
22. ePix: A class of front-end ASICs for second generation LCLS integrating hybrid pixel detectors.
23. Some Challenges Facing Scientific Software Developers: The Case of Molecular Biology.
24. Some Problems of Professional End User Developers.
25. An Addressable Test Structure for Geometrical Design Rules Characterization.
26. The nature of evidence in empirical software engineering.
27. Critical area based yield modeling on an advanced microprocessor design.
28. Critical area based yield prediction using in-line defect classification information [DRAMs].
29. eLine100: A Front End ASIC for LCLS Detectors in Low Noise Applications.
30. Impact of simulation parameters on critical area analysis.
31. A framework for extracting defect density information for yield modeling from in-line defect inspection for real-time prediction of random defect limited yields.
32. Using electrical bitmap results from embedded memory to enhance yield.
33. Electrical Defect Density Test Structures for DFM in the Sub-wavelength Lithography Regime with Copper Metallization.
34. Performance of a silicon microstrip detector in a very high rate environment.
35. An Adaptive Retransmission Technique for Use in a Slotted-ALOHA Channel.
36. Using a stochastic context-free grammar as a language model for speech recognition
37. An overview of BiCMOS technology and applications
38. The Nature of Evidence in Empirical Software Engineering
39. A framework for extracting defect density information for yield modeling from in-line defect inspection for real-time prediction of random defect limited yields
40. The Role of Story Cards and the Wall in XP teams: A Distributed Cognition Perspective
41. Status of the silicon strip high-rate FASTBUS readout system
42. BiFAMOS technology for high speed mega-bit EPROMs.
43. The role of story cards and the wall in XP teams: a distributed cognition perspective.
44. Test as a key enabler for faster yield ramp-up.
45. Performance of a silicon microstrip detector in a very high rate environment.
46. Simulation of charge cloud evolution in silicon drift detectors.
47. Using a stochastic context-free grammar as a language model for speech recognition.
48. An overview of BiCMOS technology and applications.
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