8 results on '"Ney, David"'
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2. Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS
3. Moisture Diffusion in Dense SiO2 and Ultra Low k Integrated Stacks
4. Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions
5. Redundancy method to assess electromigration lifetime in power Grid design
6. Managing SRAM reliability from bitcell to library level
7. On-Chip High-Frequency Diagnostic of RSFQ Logic Cells.
8. Microstructure local effect for electromigration reliability improvement and Cu damascene lines design rules relaxation.
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