7 results on '"Ho, J.H."'
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2. A new observation of the germanium outdiffusion effect on the hot carrier and nbti reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices
3. Low leakage reliability characterization methodology for advanced CMOS with gate oxide in the 1nm range
4. A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices.
5. Symmetrical 45nm PMOS on [110] substrate with excellent S/D extension distribution and mobility enhancement.
6. Performance of 70 nm strained-silicon CMOS devices.
7. Kinematics and control of redundantly actuated closed chains.
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