Search

Your search keyword '"Ho, J.H."' showing total 7 results

Search Constraints

Start Over You searched for: Author "Ho, J.H." Remove constraint Author: "Ho, J.H." Publisher ieee Remove constraint Publisher: ieee
7 results on '"Ho, J.H."'

Search Results

3. Low leakage reliability characterization methodology for advanced CMOS with gate oxide in the 1nm range

6. Performance of 70 nm strained-silicon CMOS devices.

Catalog

Books, media, physical & digital resources