14 results on '"Hashimoto C"'
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2. Parser Adaptation to Patent Domain Exploiting Case Frames.
3. Practical scheduling and line optimization technology for ASIC manufacturing lines.
4. Degradation of I/O devices due to ESD-induced dislocations.
5. A Flexible ASIC CIM System (Orchard II).
6. Leakage-current reduction in thin Ta/sub 2/O/sub 5/ films for high-density VLSI memories.
7. Threshold-voltage instability of n-channel MOSFET's under bias-temperature aging.
8. A low-temperature MOS LSI process.
9. Hot-electron limited operating voltages for 0.8-µm MOSFET's.
10. A Flexible ASIC CIM System (Orchard II)
11. Precise and Flexible Modeling for Semiconductor Wafer Fabrication
12. Circuit technologies for 16Mb DRAMs.
13. New Bias Sputtering System with High Throughput, High Uniformity and Low Damage.
14. Effects of process-induced mechanical stress on ESD performance.
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