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Hot-electron limited operating voltages for 0.8-µm MOSFET's.

Authors :
Shiono, N.
Hashimoto, C.
Source :
IEEE Transactions on Electron Devices; 1982, Vol. 29 Issue 10, p1630-1632, 3p
Publication Year :
1982

Details

Language :
English
ISSN :
00189383
Volume :
29
Issue :
10
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
93114095
Full Text :
https://doi.org/10.1109/T-ED.1982.20926