1. Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
- Author
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Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica, Universitat Politècnica de València. Instituto de Instrumentación para Imagen Molecular - Institut d'Instrumentació per a Imatge Molecular, European Commission, Generalitat Valenciana, U.S. Department of Energy, AGENCIA ESTATAL DE INVESTIGACION, MINISTERIO DE ECONOMIA Y EMPRESA, University of Texas at Arlington, Ministerio de Economía y Competitividad, Ministerio de Ciencia, Innovación y Universidades, Fundação para a Ciência e a Tecnologia, Portugal, Fundació Bancària Caixa d'Estalvis i Pensions de Barcelona, Ghosh, S., Haefner, J., Martín-Albo, J., Guenette, R., Li, X., Loya Villalpando, A.A., Burch, C., Adams, C., Álvarez-Puerta, Vicente, Arazi, L., Arnquist, I.J., Azevedo, C.D.R., Bailey, K., Ballester Merelo, Francisco José, Benlloch-Rodríguez, J.M., Esteve Bosch, Raul, Herrero Bosch, Vicente, Mora Mas, Francisco José, Rodriguez-Samaniego, Javier, Toledo Alarcón, José Francisco, Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica, Universitat Politècnica de València. Instituto de Instrumentación para Imagen Molecular - Institut d'Instrumentació per a Imatge Molecular, European Commission, Generalitat Valenciana, U.S. Department of Energy, AGENCIA ESTATAL DE INVESTIGACION, MINISTERIO DE ECONOMIA Y EMPRESA, University of Texas at Arlington, Ministerio de Economía y Competitividad, Ministerio de Ciencia, Innovación y Universidades, Fundação para a Ciência e a Tecnologia, Portugal, Fundació Bancària Caixa d'Estalvis i Pensions de Barcelona, Ghosh, S., Haefner, J., Martín-Albo, J., Guenette, R., Li, X., Loya Villalpando, A.A., Burch, C., Adams, C., Álvarez-Puerta, Vicente, Arazi, L., Arnquist, I.J., Azevedo, C.D.R., Bailey, K., Ballester Merelo, Francisco José, Benlloch-Rodríguez, J.M., Esteve Bosch, Raul, Herrero Bosch, Vicente, Mora Mas, Francisco José, Rodriguez-Samaniego, Javier, and Toledo Alarcón, José Francisco
- Abstract
[EN] Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
- Published
- 2020