Back to Search Start Over

Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

Authors :
Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica
Universitat Politècnica de València. Instituto de Instrumentación para Imagen Molecular - Institut d'Instrumentació per a Imatge Molecular
European Commission
Generalitat Valenciana
U.S. Department of Energy
AGENCIA ESTATAL DE INVESTIGACION
MINISTERIO DE ECONOMIA Y EMPRESA
University of Texas at Arlington
Ministerio de Economía y Competitividad
Ministerio de Ciencia, Innovación y Universidades
Fundação para a Ciência e a Tecnologia, Portugal
Fundació Bancària Caixa d'Estalvis i Pensions de Barcelona
Ghosh, S.
Haefner, J.
Martín-Albo, J.
Guenette, R.
Li, X.
Loya Villalpando, A.A.
Burch, C.
Adams, C.
Álvarez-Puerta, Vicente
Arazi, L.
Arnquist, I.J.
Azevedo, C.D.R.
Bailey, K.
Ballester Merelo, Francisco José
Benlloch-Rodríguez, J.M.
Esteve Bosch, Raul
Herrero Bosch, Vicente
Mora Mas, Francisco José
Rodriguez-Samaniego, Javier
Toledo Alarcón, José Francisco
Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica
Universitat Politècnica de València. Instituto de Instrumentación para Imagen Molecular - Institut d'Instrumentació per a Imatge Molecular
European Commission
Generalitat Valenciana
U.S. Department of Energy
AGENCIA ESTATAL DE INVESTIGACION
MINISTERIO DE ECONOMIA Y EMPRESA
University of Texas at Arlington
Ministerio de Economía y Competitividad
Ministerio de Ciencia, Innovación y Universidades
Fundação para a Ciência e a Tecnologia, Portugal
Fundació Bancària Caixa d'Estalvis i Pensions de Barcelona
Ghosh, S.
Haefner, J.
Martín-Albo, J.
Guenette, R.
Li, X.
Loya Villalpando, A.A.
Burch, C.
Adams, C.
Álvarez-Puerta, Vicente
Arazi, L.
Arnquist, I.J.
Azevedo, C.D.R.
Bailey, K.
Ballester Merelo, Francisco José
Benlloch-Rodríguez, J.M.
Esteve Bosch, Raul
Herrero Bosch, Vicente
Mora Mas, Francisco José
Rodriguez-Samaniego, Javier
Toledo Alarcón, José Francisco
Publication Year :
2020

Abstract

[EN] Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.

Details

Database :
OAIster
Notes :
TEXT, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1273092777
Document Type :
Electronic Resource