1. Improving the understanding of the KPFM technique through analyses of InP multilayers with associated modelling
- Author
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da Lisca, Mattia, Connolly, J.P., Alvarez, J, Vaissiere, Nicolas, Decobert, Jean, Kleider, Jean-Paul, Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Institut Photovoltaïque d’Ile-de-France (ITE) (IPVF), Alcatel-Thales III-V Lab (III-V Lab), THALES, and KLEIDER, Jean-Paul
- Subjects
[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic ,[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,[SPI.NRJ]Engineering Sciences [physics]/Electric power ,[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] ,[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic ,[SPI.MAT] Engineering Sciences [physics]/Materials ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,[PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] ,ComputingMilieux_MISCELLANEOUS ,[SPI.NRJ] Engineering Sciences [physics]/Electric power ,[SPI.MAT]Engineering Sciences [physics]/Materials - Abstract
International audience
- Published
- 2021