44 results on '"Shoji, Fumiya"'
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2. Elastic recoil detection analysis of coadsorption of hydrogen and deuterium on clean Si surfaces
3. Correlation between resistivity and oxygen vacancy of hydrogen-doped indium tin oxide thin films
4. Contribution to carrier densities of the oxygen vacancy in a low-resistivity tin-doped indium oxide film by the hot-cathode plasma sputtering method
5. Deterioration and recovery in the resistivity of Al-doped ZnO films prepared by the plasma sputtering
6. Effects of hydrogen in working gas for sputter-deposition on surface morphology and microstructure of indium tin oxide thin films grown at room temperature
7. Electrical properties of Al-doped ZnO films fabricated by a hot-cathode plasma sputtering method
8. Optical and electrical properties of indium tin oxide thin films sputter-deposited in working gas containing hydrogen without heat treatments
9. Fabrication of low resistivity tin-doped indium oxide films with high electron carrier densities by a plasma sputtering method
10. Morphological change of Co-nanodot on SiO2 by thermal treatment
11. Disruption of the Si(1 0 0)-2 × 1 surface by very low-energy ion irradiation
12. A low-energy ion beam system for studying energetic ion deposition on Silicon surfaces
13. Bismuth-induced surface structure of Si(100) studied by scanning tunneling microscopy
14. Effects of plasma irradiation on polysilane thin film
15. Surface-recoil processes of hydrogen on Si (100)-2×1:H and Si (100)-1×1:2H surfaces studied by low-energy He ion beams
16. Hydrogen-induced reordering of the Si(111)(3×3)Bi surface studied by scanning tunneling microscopy
17. Hydrogen analysis of silicon surfaces by low-energy ion beams
18. Low energy ion scattering study of hydrogen-induced reordering of Pb monolayer films on Si(111) surfaces
19. Coadsorption of hydrogen and deuterium on Si(100) surfaces studied by elastic recoil detection analysis
20. A Si(100)-2×1: H monohydride surface studied by low-energy recoil-ion spectroscopy
21. A Si(100)-2 × 1: H monohydride surface studied by low-energy recoil-ion spectroscopy
22. Ag thin film growth on hydrogen-terminated Si(100) surface studied by TOF-ICISS
23. Hydrogen-induced reordering of the Si(111)√3 × √3-Al surface studied by ERDA/LEED
24. Low-energy recoil ion spectroscopy studies of H on Si(111)-7 × 7
25. Hydrogen-induced reconstruction of Si(111)-√3-Ag surface studied by TOF-ICISS
26. Adsorption of H on : evidence for Ag(111) agglomerates formation
27. ISS-AES study of the initial growth stage of Cu thin films on Si(111)7 × 7
28. Sputter-deposition by a new Penning-discharge source with an axially integrated hot-cathode
29. A high energy ion scattering/channeling and low energy ion scattering apparatus for surface analysis
30. Hydrogen-induced reordering of the surface
31. Neutralization and inelastic scattering energy loss of low energy He+ ions at InP(110) surfaces
32. High-energy ion channeling study of the atomic displacement of Si(111) surfaces induced by Ag thin films
33. Structural study of Ag overlayers deposited on a Si(111) substrate by impact-collision ion-scattering-spectroscopy with time-of-flight detection
34. RBS/channeling study on the annealing behavior of Cu thin films on Si(100) and (111) substrates
35. Elastic recoil detection analysis of hydrogen adsorbed on solid surfaces
36. High-resolution ion scattering spectrometry at energies ranging from 200 to 2000 eV
37. Inelastic effects in low-energy ion-surface collisions: He+-Pb
38. Inelastic effect in low energy ion-surface collisions: He+Au, Ag
39. Surface hydrogen detection by low energy 4He+ ion scattering spectroscopy
40. Monte Carlo simulation of channeling effects in high energy (MeV) phosphorus ion implantation into crystalline silicon targets
41. Study of surface segregation of simultaneously evaporated Mn-Ag alloy films by means of ion scattering spectroscopy and Auger electron spectroscopy
42. Inelastic effects in low energy He+ ion scattering from solid and atomic Pb targets
43. Initial growth process and surface structure of Ag on Si(111) studied by low-energy Ion-Scattering Spectroscopy (ISS) and LEED-AES
44. Computer simulation of the effect of disordered surface layers on the reflection of phosphorus ions from silicon (100) crystalline targets in grazing incidence ion implantation
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