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Abstract: In this work we report an experimental observation of the current dependence on the defect generation probability driving to breakdown. We propose the MVHR model (multi-vibrational hydrogen release) based on the multi-vibrational excitation of the Si–H bond stretching mode. By this way we explain the power-law dependence of charge and time to breakdown and highlight its limit on PMOS inversion. [Copyright &y& Elsevier]

Abstract: In this work we present an experimental evidence of a current dependence of the defect generation probability driving to breakdown. Based on this observation we explain the power law dependence of the charge and the time to breakdown and show its limit on pmos inversion. [Copyright &y& Elsevier]

A large database of time-dependent dielectric breakdown study was conducted on 50 A˚ SiO2 film over a wide range of temperature (125–300 °C) and a large range of voltage stress (−4.4 to −6.8 V). Using an accurate methodology, we suppress any correlation between voltage and temperature dependence of the voltage acceleration factor and the activation energy. A possible origin of the non-Arrhenius temperature dependence is discussed and a valid window for E-model lifetime prediction is defined. This study shows the high temperature impact on the reliability projection and point at the difficulty to predict the time-to-breakdown using activation energy as an extrapolation parameter. [Copyright &y& Elsevier]

In the light of changing nutritional trends and recommendations, yoghurt style gels from plant proteins are a promising way to incorporate relevant amounts of plant derived proteins into the diet. However, in order to attain a high level of consumer acceptance, a thorough understanding of rheological behaviour, involved protein fractions and relevant interactions is mandatory in order to later be able to customise properties of fermentation induced gels. Therefore, the aim of this study was to first characterise the type of dominating interactions within the gel network and the protein fractions involved followed by determination of the rheological properties of gels made from pea protein and pea protein hydrolysates. Results showed that the protein-protein interactions were mainly hydrophobic in nature and involved mostly the legumin fraction. A smaller contribution could be ascribed to electrostatic interactions between vicilin and the basic legumin-β chain, thus incorporating some vicilin into the gel. The interaction between vicilin and the basic legumin-β chain was influenced by modification of the molecular weight distribution via enzymatic hydrolysis. Especially hydrolysis with trypsin led to an enhanced involvement of vicilin in the gel structure due to the increased availability of legumin-β. The molecular weight distribution only had a minor impact on the rheological properties of the fermentation induced pea protein gels leading to the conclusion that in rheology the type of interactions is more important, than the protein fractions involved. Image 1 • Fermented pea protein gels are mainly stabilised by hydrophobic interactions. • Legumin is the dominating pea protein fraction in fermentation induced gels. • Peptides smaller than 17 kDa are not part of the gel structure. • Hydrolytic changes in molecular weight profile influence the incorporation of vicilin into the gel. • Influence of interactions on rheological properties dominates influence of protein fractions. [ABSTRACT FROM AUTHOR]

Abstract: Several simplifications on MOSFET compact model for oxide breakdown degradation are presented. The current partitioning coefficient is systematically investigated, including influence of drain voltage and increasing breakdown strength. It reveals that several conduction paths are formed during breakdown and that the reduction of channel conductance is the dominant phenomenon at operating voltages. Based on these observations, a new physically based compact model including soft breakdown (SBD) is proposed. KW: soft breakdown, characterization, modeling, reliability. [Copyright &y& Elsevier]

Abstract: Assessment of design implications due to degradation of CMOS devices is increasingly required in the latest technologies. This paper presents selected topics relevant to realize an efficient design-in reliability methodology in the latest generation CMOS technologies. NBTI is discussed in terms of characterization using On-The-Fly (OTF) methodology. Extension of OTF method is discussed using bias patterns to gain insights into NBTI under analog operation. A reliability simulation methodology is discussed against requirements for optimization and integration within an existing design flow. The features of this methodology are illustrated using some simple design examples. [Copyright &y& Elsevier]